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Apparatus and method for detecting photon emissions from transistors

  • US 7,323,862 B2
  • Filed: 04/25/2006
  • Issued: 01/29/2008
  • Est. Priority Date: 09/03/2002
  • Status: Expired due to Fees
First Claim
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1. A method for analyzing and displaying collected photon emissions data of a plurality of photons to discriminate between photons emitted from a transistor and photons emitted from other sources, the collected photon emissions data of each photon comprising a spatial component and a temporal component respectively corresponding with a location where the photon was detected and a time when the photon was detected, the method comprising:

  • correlating the collected photon emissions data of each photon with the collected photon emission data of some or all of the plurality of photons to obtain correlated photon emission data for the photon;

    assigning a weight to each photon as a function of the correlated photon emission data of the photon;

    determining from the weight of each photon a likelihood that the photon originated from a transistor photon emission; and

    displaying the likelihood.

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