Method and apparatus for detecting atomic particles
First Claim
Patent Images
1. An atomic particle detection assembly comprising:
- at least one atomic particle detector positioned within a first chamber having a first operating pressure; and
at least one junction apparatus coupled to said at least one atomic particle detector, said at least one junction apparatus comprising at least one wall that at least partially defines a second chamber having a second operating pressure, wherein the second pressure is greater than the first pressure, wherein said at least one junction apparatus facilitates maintaining a pre-determined pressure difference between said first chamber and said second chamber.
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Abstract
An atomic particle detection assembly includes at least one atomic particle detector positioned within a first chamber having a first operating pressure. The assembly also includes at least one junction apparatus coupled to the at least one atomic particle detector. The at least one junction apparatus includes at least one wall that at least partially defines a second chamber having a second operating pressure. The second pressure is greater than the first pressure and the at least one junction apparatus facilitates maintaining a predetermined pressure difference between the first chamber and the second chamber.
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Citations
20 Claims
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1. An atomic particle detection assembly comprising:
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at least one atomic particle detector positioned within a first chamber having a first operating pressure; and at least one junction apparatus coupled to said at least one atomic particle detector, said at least one junction apparatus comprising at least one wall that at least partially defines a second chamber having a second operating pressure, wherein the second pressure is greater than the first pressure, wherein said at least one junction apparatus facilitates maintaining a pre-determined pressure difference between said first chamber and said second chamber. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of detecting atomic particles, said method comprising:
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providing a structure having a first chamber and a second chamber separated by a wall, wherein the first chamber has a first operating pressure that is less than a second operating pressure within the second chamber; positioning at least one detection assembly within the first chamber, wherein the at least one assembly includes at least one junction apparatus that defines at least a third chamber that is coupled in flow communication with the second chamber; coupling a plurality of particle detectors to the junction apparatus; positioning at least one atomic particle source within the first chamber; and exposing the detection assembly to the atomic particle source such that a plurality of atomic particles impinge upon the at least one detection assembly. - View Dependent Claims (10, 11, 12, 13, 14)
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- 15. An atomic particle detection array positioned within a first chamber having a first operating pressure comprising a plurality of atomic particle detection assemblies, said plurality of atomic particle detection assemblies positioned such that a distance defined between adjacent atomic particle detection assemblies is mitigated, each of said plurality of atomic particle detection assemblies comprising at least one junction apparatus coupled to each of said plurality of atomic particle detection assemblies, said at least one junction apparatus comprising at least one wall that at least partially defines a second chamber having a second operating pressure, wherein the second operating pressure is greater than the first pressure, wherein said at least one junction apparatus facilitates maintaining a pre-determined pressure difference between said first chamber and said second chamber.
Specification