Method and apparatus for detecting atomic particles

• US 7,335,890 B2
• Filed: 06/22/2006
• Issued: 02/26/2008
• Est. Priority Date: 06/22/2006
• Status: Active Grant

• Current Assignee: Baker Hughes, a GE Company, LLC (Baker Hughes Company)
• Original Assignee: General Electric Company
• Inventors: Utterback, Kari
• Primary Examiner(s): Porta; Dave
• Assistant Examiner(s): Taningco; Marcus H
• Application Number:
  US11/425,789
• Publication Number:
  US 20070295913A1
• Time in Patent Office: 614 Days
• Field of Search: 250/370.02
• US Class Current: 250/370.02
• CPC Class Codes: G01T 3/06 with scintillation detectors

Abstract

An atomic particle detection assembly includes at least one atomic particle detector positioned within a first chamber having a first operating pressure. The assembly also includes at least one junction apparatus coupled to the at least one atomic particle detector. The at least one junction apparatus includes at least one wall that at least partially defines a second chamber having a second operating pressure. The second pressure is greater than the first pressure and the at least one junction apparatus facilitates maintaining a predetermined pressure difference between the first chamber and the second chamber.

Claims

1. An atomic particle detection assembly comprising:

at least one atomic particle detector positioned within a first chamber having a first operating pressure; and

at least one junction apparatus coupled to said at least one atomic particle detector, said at least one junction apparatus comprising at least one wall that at least partially defines a second chamber having a second operating pressure, wherein the second pressure is greater than the first pressure, wherein said at least one junction apparatus facilitates maintaining a pre-determined pressure difference between said first chamber and said second chamber.

2. An atomic particle detection assembly in accordance with claim 1 wherein said at least one junction apparatus is configured to operate with a substantially standard atmospheric pressure within said second chamber.

3. An atomic particle detection assembly in accordance with claim 1 wherein said at least one particle detector comprises at least one wall that at least partially defines a third chamber having a third operating pressure, the third pressure is greater than the first pressure.

4. An atomic particle detection assembly in accordance with claim 1 wherein said at least one atomic particle detector comprises at least two adjacent atomic particle detectors positioned such that a distance between the at least two adjacent atomic particle detectors is mitigated.

5. An atomic particle detection assembly in accordance with claim 1 wherein said at least one junction apparatus further comprises:

at least one body;

at least one adaptor plate coupled to said at least one body;

at least one cover plate coupled to said at least one adaptor plate; and

at least one fixture coupled to said at least one body configured to facilitate passage of at least one electrical wire.

6. An atomic particle detection assembly in accordance with claim 5 wherein said at least one junction apparatus further comprises at least one seal configured to facilitate maintaining said pre-determined pressure difference between said first chamber and said second chamber.

7. An atomic particle detection assembly in accordance with claim 6 wherein said at least one seal comprises:

at least one compression plate;

at least one seal ring positioned between said compression plate and said body;

at least one seal ring positioned between said cover plate and said adaptor plate; and

at least one seal ring positioned between said body and at least a portion of a structure wall.

8. An atomic particle detection assembly in accordance with claim 1 further comprising at least one support member extending from said at least one junction apparatus.

9. A method of detecting atomic particles, said method comprising:

providing a structure having a first chamber and a second chamber separated by a wall, wherein the first chamber has a first operating pressure that is less than a second operating pressure within the second chamber;

positioning at least one detection assembly within the first chamber, wherein the at least one assembly includes at least one junction apparatus that defines at least a third chamber that is coupled in flow communication with the second chamber;

coupling a plurality of particle detectors to the junction apparatus;

positioning at least one atomic particle source within the first chamber; and

exposing the detection assembly to the atomic particle source such that a plurality of atomic particles impinge upon the at least one detection assembly.

10. A method in accordance with claim 9 further comprising evacuating substantially all of the fluid from the first chamber such that the first pressure is a negative pressure.

11. A method in accordance with claim 9 wherein providing a structure further comprises maintaining the second operating pressure at a substantially standard atmospheric pressure.

12. A method in accordance with claim 9 wherein positioning at least one detection assembly within the first chamber comprises positioning a plurality of seals between the first chamber and the second chamber to facilitate maintaining a pre-determined pressure differential between the first chamber and the second chamber.

13. A method in accordance with claim 12 wherein positioning a plurality of seals between the first chamber and the second chamber comprises positioning at least one seal between each detector and the junction apparatus to facilitate preventing fluid communication between the first chamber and the third chamber.

14. A method in accordance with claim 12 wherein positioning a plurality of seals between the first chamber and the second chamber comprises positioning at least one seal between the junction apparatus and the second chamber to facilitate preventing fluid communication between the first chamber and the second chamber.

15. An atomic particle detection array positioned within a first chamber having a first operating pressure comprising a plurality of atomic particle detection assemblies, said plurality of atomic particle detection assemblies positioned such that a distance defined between adjacent atomic particle detection assemblies is mitigated, each of said plurality of atomic particle detection assemblies comprising at least one junction apparatus coupled to each of said plurality of atomic particle detection assemblies, said at least one junction apparatus comprising at least one wall that at least partially defines a second chamber having a second operating pressure, wherein the second operating pressure is greater than the first pressure, wherein said at least one junction apparatus facilitates maintaining a pre-determined pressure difference between said first chamber and said second chamber.

16. An atomic particle detection array in accordance with claim 15 wherein each of said plurality of detection assemblies comprises at least one wall that at least partially defines a third chamber having a third operating pressure, the third pressure is greater than the first pressure.

17. An atomic particle detection array in accordance with claim 15 wherein each of said plurality of detection assemblies comprises at least two adjacent atomic particle detectors positioned such that a distance between the at least two adjacent atomic particle detectors is mitigated.

18. An atomic particle detection array in accordance with claim 15 wherein said at least one junction apparatus further comprises:

at least one body;

at least one adaptor plate coupled to said at least one body;

at least one cover plate coupled to said at least one adaptor plate; and

at least one fixture coupled to said at least one body configured to facilitate passage of at least one electrical wire.

19. An atomic particle detection array in accordance with claim 18 wherein said at least one junction apparatus further comprises at least one seal configured to facilitate maintaining said predetermined pressure difference between said first chamber and said second chamber.

20. An atomic particle detection array in accordance with claim 19 wherein said at least one seal comprises:

at least one compression plate;

at least one seal ring positioned between said compression plate and said body;

at least one seal ring positioned between said cover plate and said adaptor plate; and

at least one seal ring positioned between said body and at least a portion of a structure wall.