Die sorting apparatus and method
First Claim
Patent Images
1. A die sorting apparatus for a wafer, comprising:
- a map file for storing records of testing information based upon testing performed on individual dice in the wafer and relative logical positions of the dice;
an image capturing device operative to acquire an image of at least a portion of the wafer comprising at least two individual dice, wherein the image shows physical coordinates of the at least two individual dice after the dice have been singulated;
a processing device operative to associate the logical position of each of the individual dice from the map file with the physical coordinates of each of the at least two individual dice as calculated from the image of the wafer and to generate a data file based on the association of the logical position and the physical coordinates of each of the dice, the data file storing the actual physical coordinates and the relative logical positions of each of the dice comprised in the at least the portion of the wafer; and
a die pick-up device operative to selectively pick up dice that meet predetermined criteria according to the testing information from their actual physical positions as contained in the data file generated by the processing device.
1 Assignment
0 Petitions
Accused Products
Abstract
A die sorting apparatus for a wafer is provided that associates logical positions of each die from a map file for storing records of testing information based upon testing performed on individual dice comprised in the wafer with its physical position as illustrated by an image acquired by an image capturing device showing physical positions of the dice, after the dice have been singulated. A processing device can thus determine actual physical positions of the dice for reference by a die pick-up device configured to selectively pick up dice that meet predetermined criteria according to the testing information from their actual physical positions as determined.
12 Citations
19 Claims
-
1. A die sorting apparatus for a wafer, comprising:
-
a map file for storing records of testing information based upon testing performed on individual dice in the wafer and relative logical positions of the dice; an image capturing device operative to acquire an image of at least a portion of the wafer comprising at least two individual dice, wherein the image shows physical coordinates of the at least two individual dice after the dice have been singulated; a processing device operative to associate the logical position of each of the individual dice from the map file with the physical coordinates of each of the at least two individual dice as calculated from the image of the wafer and to generate a data file based on the association of the logical position and the physical coordinates of each of the dice, the data file storing the actual physical coordinates and the relative logical positions of each of the dice comprised in the at least the portion of the wafer; and a die pick-up device operative to selectively pick up dice that meet predetermined criteria according to the testing information from their actual physical positions as contained in the data file generated by the processing device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
-
-
10. A method of sorting a wafer including singulated dice, comprising the steps of:
-
providing a map file containing records of testing information based upon testing performed on individual dice in the wafer and relative logical positions of the dice; acquiring an image of at least a portion of the wafer comprising at least two individual dice after the dice have been singulated, the acquired image showing physical coordinates of the at least two individual singulated dice; associating the logical positions of each of the individual dice from the map file with the physical coordinates of each of the at least two individual dice as calculated from the image; generating a data file based on the association of the logical position and the physical coordinates of each of the dice, the data file storing the actual physical coordinates and the relative logical positions of each of the dice comprised in the at least the portion of the wafer; and
thereafterselectively picking up dice that meet predetermined criteria according to the testing information from the actual physical coordinates contained in the data file. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19)
-
Specification