Methods and systems for detecting proximity of an object

• US 7,348,538 B2
• Filed: 02/03/2006
• Issued: 03/25/2008
• Est. Priority Date: 02/03/2006
• Status: Expired due to Fees

• Current Assignee: Amphenol Thermometrics, Inc. (Amphenol Corporation)
• Original Assignee: GE Infrastructure Sensing Incorporated (General Electric Company)
• Inventors: Twiney, Robert Christopher, Gangadharan, Ganesh Chandan
• Primary Examiner(s): EPPS, GEORGIA Y
• Assistant Examiner(s): Ellis; Suezu
• Application Number:
  US11/347,711
• Publication Number:
  US 20070181784A1
• Time in Patent Office: 781 Days
• Field of Search: 340/435, 250/342, 250/353, 250/221
• US Class Current: 250/221
• CPC Class Codes: G01V 8/10 Detecting, e.g. by using light barriers by reflection from the object G01S17/00

Abstract

Methods and systems for detecting a proximity of an object are provided. The method includes receiving a first beam of radiation from a first field of view directed onto a first detector and a second beam of radiation from a second field of view directed onto a second detector wherein the second beam is angularly displaced from the first beam by a predetermined amount, generating a first output signal from the first detector correlative to the energy received from the first beam and a second output signal from the second detector correlative to the energy received from the second beam, and outputting a proximity signal indicative of the proximity of an object when a differential between the first and second output signals exceeds a predetermined threshold.

Claims

1. A method of detecting a proximity of an object, said method comprising:

receiving a first beam of radiation from a first field of view directed onto a first detector and a second beam of radiation from a second field of view directed onto a second detector wherein the second beam is angularly displaced from the first beam by a predetermined amount wherein the received beams of radiation are received at the detectors off focus;

generating a first output signal from the first detector correlative to the energy received from the first beam and a second output signal from the second detector correlative to the energy received from the second beam; and

outputting a proximity signal indicative of the proximity of an object when a differential between the first and second output signals exceeds a predetermined threshold.

2. A method in accordance with claim 1 further comprising reflecting the first and second beams through a first and a second respective mirror.

3. A method in accordance with claim 1 further comprising directing the first and second beams to the first and the second detectors respectively using a respective parabolic mirror.

4. A method in accordance with claim 1 wherein receiving a first beam of radiation from a first field of view directed onto a first detector and a second beam of radiation from a second field of view directed onto a second detector comprises receiving the respective beams of radiation at the detectors such that the beam energy is substantially uniform across each respective detector.

5. A proximity sensor comprising:

a first detector configured to receive a first beam of radiation from a first field of view wherein the first beam of radiation is received off focus at the first detector and to generate a first output signal correlative to the energy received from said first beam;

a second detector configured to receive a second beam of radiation from a second field of view wherein the second beam of radiation is received off focus at the second detector and to generate a second output signal correlative to the energy received from said second beam wherein said second beam is displaced from said first beam by a predetermined angle; and

an electronic circuit configured to output a proximity signal indicative of the proximity of an object when a differential between the first and second output signals exceeds a predetermined threshold.

6. A proximity sensor in accordance with claim 5 wherein said first and second detectors are formed at least one of on a single substrate and within the same package.

7. A proximity sensor in accordance with claim 5 wherein said electronic circuit and said first and second detectors are formed at least one of on a single substrate and within the same package.

8. A proximity sensor in accordance with claim 5 wherein said second beam is displaced from said first beam by an angle of approximately sixty-two degrees.

9. A proximity sensor in accordance with claim 5 wherein said first detector is configured to receive the first beam of radiation from the first field of view that includes an ambient temperature and said second detecto is configured to receive the second beam of radiation from the second field of view that includes a temperature of a proximate object.

10. A proximity sensor in accordance with claim 5 further comprising:

a first parabolic mirror configured to direct said first beam of radiation towards said first detector; and

a second parabolic mirror configured to direct said second beam of radiation towards said second detector.

11. A proximity sensor in accordance with claim 10 wherein said first parabolic mirror and said second parabolic mirror are fabricated off axis with respect to the beams of radiation as a unitary member.

12. A system for determining a proximity to an object, said system comprising:

a first detector in optical communication with a first field of view through a first reflector wherein a first beam of radiation in the first field of view is off focus at the first detector;

a second detector in optical communication with a second field of view through a second reflector wherein a second beam of radiation in the second field of view is off focus at the second detector; and

an electronic circuit configured to receive first and second temperature signals from said first and second detectors respectively, said electronic circuit further configured to output a proximity signal indicative of the proximity of an object using the first and second temperature signals.

13. A system in accordance with claim 12 wherein said first and second detectors are formed at least one of on a single substrate and within the same package.

14. A system in accordance with claim 12 wherein said second beam is displaced from said first beam by an angle of approximately sixty-two degrees.

15. A system in accordance with claim 12 wherein said first detector is configured to receive the first beam of radiation from the first field of view that is indicative of an ambient temperature and said second detector is configured to receive the second beam of radiation from the second field of view that is indicative of a temperature of a proximate object.

16. A system in accordance with claim 12 wherein said first reflector comprises a first parabolic mirror configured to direct said first beam of radiation towards said first detector;

and said second reflector comprises a second parabolic mirror configured to direct said second beam of radiation towards said second detector.

17. A system in accordance with claim 12 wherein said first and second detectors are formed into a single package, said first and second reflectors are unitarily formed and coupled directly to said single package such that a relative alignment of said first and second detectors and said first and second reflectors is facilitated.