Method for verifying sensor condition

• US 7,348,771 B2
• Filed: 09/18/2006
• Issued: 03/25/2008
• Est. Priority Date: 09/07/1999
• Status: Expired due to Fees

• Current Assignee: Jentek Sensors, Inc.
• Original Assignee: Jentek Sensors, Inc.
• Inventors: Tsukemik, Vladimir, Goldfine, Neil J., Schlicker, Darrell E., Washabaugh, Andrew P., Zilberstein, Vladimir A., Walrath, Karen E.
• Primary Examiner(s): Patidar; Jay M
• Application Number:
  US11/522,628
• Publication Number:
  US 20070120561A1
• Time in Patent Office: 554 Days
• Field of Search: 324/202, 324/227, 324229-243, 324/225, 324/209
• US Class Current: 324/240
• CPC Class Codes: G01B 7/24 using change in magnetic properties
• CPC Class Codes: G01B 7/34 for measuring roughness or irregularity of surfaces
• CPC Class Codes: G01N 27/20 Investigating the presence of flaws
• CPC Class Codes: G01N 27/72 by investigating magnetic variables
• CPC Class Codes: G01N 27/902 by moving the sensors
• CPC Class Codes: G01R 33/12 Measuring magnetic properties of articles or specimens of solids or fluids involving magnetic resonance G01R33/20

Abstract

Sensor condition verification may be performed on electromagnetic sensors and sensor arrays mounted to a material surface. The sensors typically have a periodic winding or electrode structure that creates a periodic sensing field when driven by an electrical signal. The sensors can be thin and flexible so that they conform to the surface of the test material. Monitoring the conductivity changes of a test material, with changes in temperature, may provide a mechanism for testing the integrity of the sensor. Changes in the conductivity, due to changes in temperature, without significant lift-off changes may verify the calibration of the sensor and that the sensor elements themselves are intact.

Claims

1. A method of verifying sensor condition comprising:

mounting an electromagnetic sensor on a test material surface;

periodically measuring at least one electrical property of the material under a sensor footprint, with sensor response measurements being made at two or more test material temperatures; and

verifying sensor condition from the sensor response with change in temperature.

2. A method as claimed in claim 1 where the sensor is an eddy current sensor.

3. A method as claimed in claim 1 where the sensor is a conformable spatially periodic field eddy current sensor.

4. A method as claimed in claim 3 where the sensor has a periodic primary winding to excite a periodic magnetic field and at least one sensing element to detect variations in the magnetic field related to electrical properties of the material under test.

5. A method as claimed in claim 4 where multiple sensing elements are used to measure absolute electrical conductivity at each sensing element location with at least one primary current excitation frequency.

6. A method as claimed in claim 5 where at least one sensing element is located in a region expected to see less damage than at other elements.

7. A method as claimed in claim 6 where the sensing element at the location of less damage is used as a reference for measurements at other elements.

8. A method as claimed in claim 1 further comprising intentionally varying the temperature of the material under test to verify the proper performance of the sensor.

9. A method as claimed in claim 1 further comprising intentionally varying the temperature of the material under test, recording the temperature variations with a temperature measurement sensor, and recording the sensor data at a plurality of temperature levels.

10. A method as claimed in claim 9 further comprising calibrating the sensor using the sensor data at different temperatures.

11. A method as claimed in claim 9 further comprising assessing the test material condition using sensor data at multiple temperatures.

12. A method as claimed in claim 1 where the sensor is a dielectrometer.

13. A method as claimed in claim 1 where a second sensor is incorporated with the electromagnetic sensor.

14. A method as claimed in claim 13 where the second sensor is a strain gauge.

15. A method as claimed in claim 13 where the second sensor is a temperature gauge.

16. A method as claimed in claim 1 where verifying sensor operation further comprises monitoring sensor lift-off at the two or more test material temperatures.

17. A method of verifying sensor condition comprising:

mounting an electromagnetic sensor on a test material surface, where the sensor comprises a drive conductor to carry an applied electric current and at least one sensing element to measure the electrical properties of the material under test;

periodically measuring at least one electrical property of the material under a sensor footprint, with sensor response measurements being made at two or more test material temperatures13; and

verifying sensor condition from the sensor response with change in temperature.

18. A method as claimed in claim 17 where the sensing elements are absolute inductive coils.

19. A method as claimed in claim 17 where the sensing elements are magnetoresistive elements.

20. A method as claimed in claim 17 where verifying sensor operation further comprises monitoring sensor lift-off at the two or more test material temperatures.