Test system for integrated circuits
First Claim
Patent Images
1. A device for transporting integrated circuit chips and for testing said integrated circuit chips during said transporting, said device comprising:
- an in-transit box adapted to transport said integrated circuit chips;
a plurality of test boxes mounted in said in-transit box;
a plurality of test boards mounted in each one of said test boxes and adapted to test said integrated circuit chips during said transporting of said integrated circuit chips; and
a power supply in each of said test boxes, connected to each of said test boards, and adapted to supply power to said test boards during said transporting and said testing of said integrated circuit chips,wherein each of said test boards comprises;
multiple sockets adapted to hold and electrically connect to multiple integrated circuit chips; and
testing circuitry electrically connected to said sockets for testing said multiple integrated circuit chips.
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Accused Products
Abstract
A test board includes a plurality of sockets for connection to a plurality of integrated circuit chips to be tested. A test control device on the board turns on at least one test engine for testing the plurality of chips simultaneously. A checking circuit verifies the functionality of each chip by comparing outputs of chips with each other or with a golden chip. Failing chips are disconnected from further testing and passing or failing chips are recorded.
57 Citations
16 Claims
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1. A device for transporting integrated circuit chips and for testing said integrated circuit chips during said transporting, said device comprising:
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an in-transit box adapted to transport said integrated circuit chips; a plurality of test boxes mounted in said in-transit box; a plurality of test boards mounted in each one of said test boxes and adapted to test said integrated circuit chips during said transporting of said integrated circuit chips; and a power supply in each of said test boxes, connected to each of said test boards, and adapted to supply power to said test boards during said transporting and said testing of said integrated circuit chips, wherein each of said test boards comprises; multiple sockets adapted to hold and electrically connect to multiple integrated circuit chips; and testing circuitry electrically connected to said sockets for testing said multiple integrated circuit chips. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A device for transporting application specific integrated circuit (ASIC) chips and for testing said application specific integrated circuit (ASIC) chips during said transporting, said device comprising:
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an in-transit box adapted to transport ASIC chips; a plurality of test boxes mounted in said in-transit box; a plurality of test boards mounted in each one of said test boxes and adapted to test said ASIC chips during said transporting of said ASIC chips; and a power supply in each of said test boxes, connected to each of said test boards, and adapted to supply power to said test boards during said transporting and said testing of said ASIC chips, wherein each of said test boards comprises; multiple sockets adapted to hold and electrically connect to multiple ASIC chips; and testing circuitry electrically connected to said sockets for testing said multiple ASIC chips, wherein said testing circuitry includes comparators arranged in parallel and electrically connected to said sockets, such that said testing circuitry tests all of said multiple ASIC chips simultaneously, and wherein said testing circuitry identifies a defective ASIC chip as one having a different output when compared to outputs of the other ASIC chips, when all of said multiple ASIC chips are supplied with identical inputs. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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Specification