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Test system for integrated circuits

  • US 7,350,108 B1
  • Filed: 09/10/1999
  • Issued: 03/25/2008
  • Est. Priority Date: 09/10/1999
  • Status: Expired due to Fees
First Claim
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1. A device for transporting integrated circuit chips and for testing said integrated circuit chips during said transporting, said device comprising:

  • an in-transit box adapted to transport said integrated circuit chips;

    a plurality of test boxes mounted in said in-transit box;

    a plurality of test boards mounted in each one of said test boxes and adapted to test said integrated circuit chips during said transporting of said integrated circuit chips; and

    a power supply in each of said test boxes, connected to each of said test boards, and adapted to supply power to said test boards during said transporting and said testing of said integrated circuit chips,wherein each of said test boards comprises;

    multiple sockets adapted to hold and electrically connect to multiple integrated circuit chips; and

    testing circuitry electrically connected to said sockets for testing said multiple integrated circuit chips.

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