Method for determining properties of a film, and apparatus for realizing the method
First Claim
1. An apparatus for determining properties of a thin film, said apparatus comprising:
- a piezoelectric substrate having a surface;
a slanted finger interdigital transducer unit provided on said surface of said piezoelectric substrate, and includinga first transmitter port that includes first and second electrodes, each of which includes a plurality of electrode fingers, each of said electrode fingers of each of said first and second electrodes of said first transmitter port having opposite first and second ends,said first ends of adjacent ones of said electrode fingers of said first electrode of said first transmitter port defining a distance therebetween that is less than that between said second ends of said adjacent ones of said electrode fingers of said first electrode of said first transmitter port,said first ends of adjacent ones of said electrode fingers of said second electrode of said first transmitter port defining a distance therebetween that is greater than that between said second ends of said adjacent ones of said electrode fingers of said second electrode of said first transmitter port, anda first receiver port that includes first and second electrodes, each of which includes a plurality of electrode fingers, each of said electrode fingers of each of said first and second electrodes of said first receiver port having opposite first and second ends,said first ends of adjacent ones of said electrode fingers of said first electrode of said first receiver port defining a distance therebetween that is less than that between said second ends of said adjacent ones of said electrode fingers of said first electrode of said first receiver port,said first ends of adjacent ones of said electrode fingers of said second electrode of said first receiver port defining a distance therebetween that is greater than thatbetween said second ends of said adjacent ones of said electrode fingers of said second electrode of said first receiver port; and
a mask disposed above said surface of said piezoelectric substrate, and defining a hole therethrough to expose a portion of said surface of said piezoelectric substrate between said first transmitter port and said first receiver port.
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Abstract
A method for determining properties or a thin film includes the steps of: providing a piezoelectric substrate; providing a slanted finger interdigital transducer unit that includes a transmitter port and a receiver port on the piezoelectric substrate; forming the thin film on the piezoelectric substrate between the transmitter port and the receiver port; applying an input signal to the transmitter port; and measuring a phase difference, which corresponds to the input signal, from the receiver port. Accordingly, properties of the thin film are determined based on the measured phase difference. An apparatus for realizing the method is also disclosed.
11 Citations
5 Claims
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1. An apparatus for determining properties of a thin film, said apparatus comprising:
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a piezoelectric substrate having a surface; a slanted finger interdigital transducer unit provided on said surface of said piezoelectric substrate, and including a first transmitter port that includes first and second electrodes, each of which includes a plurality of electrode fingers, each of said electrode fingers of each of said first and second electrodes of said first transmitter port having opposite first and second ends, said first ends of adjacent ones of said electrode fingers of said first electrode of said first transmitter port defining a distance therebetween that is less than that between said second ends of said adjacent ones of said electrode fingers of said first electrode of said first transmitter port, said first ends of adjacent ones of said electrode fingers of said second electrode of said first transmitter port defining a distance therebetween that is greater than that between said second ends of said adjacent ones of said electrode fingers of said second electrode of said first transmitter port, and a first receiver port that includes first and second electrodes, each of which includes a plurality of electrode fingers, each of said electrode fingers of each of said first and second electrodes of said first receiver port having opposite first and second ends, said first ends of adjacent ones of said electrode fingers of said first electrode of said first receiver port defining a distance therebetween that is less than that between said second ends of said adjacent ones of said electrode fingers of said first electrode of said first receiver port, said first ends of adjacent ones of said electrode fingers of said second electrode of said first receiver port defining a distance therebetween that is greater than that between said second ends of said adjacent ones of said electrode fingers of said second electrode of said first receiver port; and a mask disposed above said surface of said piezoelectric substrate, and defining a hole therethrough to expose a portion of said surface of said piezoelectric substrate between said first transmitter port and said first receiver port. - View Dependent Claims (2, 3, 4, 5)
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Specification