System and method for an improved illumination system in a lithographic apparatus
First Claim
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1. A lithographic apparatus, comprising:
- an illumination system that supplies a beam of radiation;
an array of individually controllable elements that pattern the beam; and
a projection system that projects the patterned beam onto a target portion of a substrate,wherein the array of individually controllable elements includes a substrate having a plurality of supports on which the individually controllable elements are mounted,wherein the individually controllable elements each comprise,a planar reflector, having a reflective surface substantially located in a reflecting plane, andat least two hinges each having an elongated portion, wherein the hinges are each connected at one end to the planar reflector and at the other end to one of the supports on the substrate;
wherein the length of the hinges, between the connections to the planar reflector and the support, is at least one of;
(a) half of a smallest dimension of the planar reflector across the reflecting plane, (b) equal to the smallest dimension of the planar reflector across the reflecting plane and (c) twice the smallest dimension of the planar reflector across the reflecting plane.
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Abstract
An array of individually controllable elements for use in lithography in which each of the individually controllable elements is comprised of a planar reflector mounted on supports on a substrate by way of elongate hinges.
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Citations
13 Claims
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1. A lithographic apparatus, comprising:
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an illumination system that supplies a beam of radiation; an array of individually controllable elements that pattern the beam; and a projection system that projects the patterned beam onto a target portion of a substrate, wherein the array of individually controllable elements includes a substrate having a plurality of supports on which the individually controllable elements are mounted, wherein the individually controllable elements each comprise, a planar reflector, having a reflective surface substantially located in a reflecting plane, and at least two hinges each having an elongated portion, wherein the hinges are each connected at one end to the planar reflector and at the other end to one of the supports on the substrate; wherein the length of the hinges, between the connections to the planar reflector and the support, is at least one of;
(a) half of a smallest dimension of the planar reflector across the reflecting plane, (b) equal to the smallest dimension of the planar reflector across the reflecting plane and (c) twice the smallest dimension of the planar reflector across the reflecting plane. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An array of individually controllable elements, configured to pattern a beam of radiation, comprising:
a plurality of individually controllable elements, each comprising, a planar reflector having a reflective surface substantially located in a reflecting plane, and at least two elongate hinges, and a substrate having a plurality of supports on which the individually controllable elements are mounted, wherein the hinges are each connected at one end to the planar reflector and at the other end to one of the supports on the substrate; wherein a length of the hinges is at least one of (a) half of a smallest dimension of the planar reflector across the reflecting plane, (b) eciual to the smallest dimension of the planar reflector across the reflecting plane and (c) twice the smallest dimension of the planar reflector across the reflecting plane.
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12. A device manufacturing method comprising:
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mounting a plurality of individually controllable elements on a plurality of supports on a substrate to form an array of individually controllable elements, wherein each individually controllable element includes a planar reflector; connecting a first hinge to each of the individually controllable elements and to its associated planar reflector and a second hinge to each of the individually controllable elements and to one of the supports on the substrate, a length of the first and second hinges being at least one of (a) half of a smallest dimension of the planar reflector across a reflecting plane, (b) equal to the smallest dimension of the planar reflector across the reflecting plane and (c) twice the smallest dimension of the planar reflector across the reflecting plane thereof, patterning a beam of radiation using the array of individually controllable elements; and projecting the patterned beam of radiation onto a target portion of a substrate. - View Dependent Claims (13)
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Specification