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Method for etching high dielectric constant materials and for cleaning deposition chambers for high dielectric constant materials

  • US 7,357,138 B2
  • Filed: 11/26/2003
  • Issued: 04/15/2008
  • Est. Priority Date: 07/18/2002
  • Status: Expired due to Fees
First Claim
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1. A process for removing a substance from at least a portion of the surface of a reaction chamber, said process comprising:

  • providing a reactor chamber wherein at least a portion of the surface is at least partially coated with the substance and wherein the substance has a dielectric constant of 4.1 or greater and is at least one member of the group consisting of a transition metal oxide, a transition metal silicate, a Group 13 metal oxide, a Group 13 metal silicate, a nitrogen containing transition metal oxide, a nitrogen containing transition metal silicate, or a laminate comprising at least one layer of the group consisting of a transition metal oxide, a transition metal silicate, a Group 13 metal oxide, a Group 13 metal silicate, a nitrogen containing Group 13 metal oxide, a nitrogen containing Group 13 metal silicate, a nitrogen containing transition metal oxide, a nitrogen containing transition metal silicate;

    introducing a reactive agent into the reaction chamber wherein the reactive agent comprises at least one fluoride containing compound and at least one other compound comprising BCl3 wherein the amount of fluorine-containing compound is less than 50% by volume of an amount of the at least one other compound;

    exposing the reactive agent to one or more energy sources sufficient to react the substance with the reactive agent and form a volatile product; and

    removing the volatile product from the reaction chamber.

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