Process control monitors for interferometric modulators
First Claim
1. A process control monitor for monitoring the effect of a process for manufacturing interferometric modulators on the color of light reflected by those interferometric modulators, comprising a test etalon that comprises a higher density of posts supporting a mechanical membrane in the test etalon than in interferometric modulators produced by the process.
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Accused Products
Abstract
Process control monitors are disclosed that are produced using at least some of the same process steps used to manufacture a MEMS device. Analysis of the process control monitors can provide information regarding properties of the MEMS device and components or sub-components in the device. This information can be used to identify errors in processing or to optimize the MEMS device. In some embodiments, analysis of the process control monitors may utilize optical measurements.
318 Citations
12 Claims
- 1. A process control monitor for monitoring the effect of a process for manufacturing interferometric modulators on the color of light reflected by those interferometric modulators, comprising a test etalon that comprises a higher density of posts supporting a mechanical membrane in the test etalon than in interferometric modulators produced by the process.
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4. A method of monitoring the effect of a process for manufacturing interferometric modulators on the color of light reflected by those interferometric modulators, the method comprising:
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forming a test etalon that comprises a higher density of posts supporting a mechanical membrane in the test etalon than in interferometric modulators produced by the process; and detecting light reflected from the test etalon. - View Dependent Claims (5, 6, 7, 8, 9, 10, 11, 12)
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Specification