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Circuit testing with ring-connected test instrument modules

  • US 7,370,255 B2
  • Filed: 02/01/2005
  • Issued: 05/06/2008
  • Est. Priority Date: 08/17/2001
  • Status: Expired due to Fees
First Claim
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1. A test apparatus comprising:

  • a main module including a global clock;

    a first module synchronized with respect to the global clock and programmed to issue a first trigger signal;

    a second module synchronized with respect to the global clock and programmed to issue a second trigger signal;

    a third module synchronized with respect to the global clock and programmed to be triggered in response to a third trigger signal that is based on the first and second trigger signals, wherein said first, second, and third modules perform testing operations, and wherein said first, second, and third trigger signals coordinate performance of said testing operations; and

    a ring bus connecting the first module, the second module, and the third module.

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