Circuit testing with ring-connected test instrument modules
First Claim
1. A test apparatus comprising:
- a main module including a global clock;
a first module synchronized with respect to the global clock and programmed to issue a first trigger signal;
a second module synchronized with respect to the global clock and programmed to issue a second trigger signal;
a third module synchronized with respect to the global clock and programmed to be triggered in response to a third trigger signal that is based on the first and second trigger signals, wherein said first, second, and third modules perform testing operations, and wherein said first, second, and third trigger signals coordinate performance of said testing operations; and
a ring bus connecting the first module, the second module, and the third module.
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Abstract
Method and apparatus for circuit testing with ring-connected test instrument modules. A system for controlling one or more test instruments to test one or more integrated circuits includes a master clock and a controller. The test instruments are connected to form a communication ring. The master clock is connected to each test instrument and provides a clock signal to the one or more test instruments. The controller is connected to the communication ring and is configured to align counters of test instruments to derive a common clock time value from the clock signal. The controller is further configured to generate and send data words into the communication ring to carry the data words to each test instrument. The data words includes at least one data word specifying a test event to be performed, a common clock time value, and at least one of the test instruments.
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Citations
24 Claims
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1. A test apparatus comprising:
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a main module including a global clock; a first module synchronized with respect to the global clock and programmed to issue a first trigger signal; a second module synchronized with respect to the global clock and programmed to issue a second trigger signal; a third module synchronized with respect to the global clock and programmed to be triggered in response to a third trigger signal that is based on the first and second trigger signals, wherein said first, second, and third modules perform testing operations, and wherein said first, second, and third trigger signals coordinate performance of said testing operations; and
a ring bus connecting the first module, the second module, and the third module. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of testing an electronic device using an apparatus having first, second and third test instruments connected to each other through a ring bus, comprising the steps of:
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issuing a first trigger command at the first test instrument onto the ring bus; issuing a second trigger command at the second test instrument onto the ring bus after receipt of the first trigger command; and at a third test instrument, supplying test signals to the electronic device in response to a third trigger command that is based on the first and second trigger commands. - View Dependent Claims (10, 11, 12, 13, 14, 15)
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16. In a test apparatus having a plurality of test instruments connected to each other over a ring bus, a method of triggering at least one of the test instruments based on events at two or more test instruments, comprising the steps of:
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monitoring an event status of at least two test instruments for N cycles; generating at least first and second N-bit data, the first N-bit data indicating an event status history of a first one of said at least two test instruments during the N cycles, the second N-bit data indicating an event status history of a second one of said at least two test instruments during the N cycles; and triggering said at least one of the test instruments based on at least the first and second N-bit data. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24)
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Specification