Extended input/output measurement block
First Claim
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1. In a computer channel subsystem, a method for obtaining a block of I/O measurement data, the method comprising the steps of:
- determining an address of a subchannel measurement block for a subchannel for directly accessing a subchannel measurement block without having to use a measurement block origin or measurement block index to obtain the address of the subchannel measurement block, the subchannel measurement block comprising a device busy time field;
obtaining measurement data related to performance of an I/O operation of the subchannel, the measurement data comprising a device busy time value, wherein the device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel; and
storing the obtained device busy time value in the device busy time field of the subchannel measurement block specified by the obtained address.
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Abstract
An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.
73 Citations
24 Claims
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1. In a computer channel subsystem, a method for obtaining a block of I/O measurement data, the method comprising the steps of:
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determining an address of a subchannel measurement block for a subchannel for directly accessing a subchannel measurement block without having to use a measurement block origin or measurement block index to obtain the address of the subchannel measurement block, the subchannel measurement block comprising a device busy time field; obtaining measurement data related to performance of an I/O operation of the subchannel, the measurement data comprising a device busy time value, wherein the device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel; and storing the obtained device busy time value in the device busy time field of the subchannel measurement block specified by the obtained address. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A system for obtaining a block of I/O measurement data, the system comprising:
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a memory; a computer system in communication with the memory, the computer system comprising an instruction fetching unit for fetching instructions from memory and one or more execution units for executing fetched instructions, for; a) directly accessing a subchannel measurement block without having to use a measurement block origin or measurement block index to obtain the address of the subchannel measurement block, the subchannel measurement block comprising a device busy time field; b) obtaining measurement data related to performance of an I/O operation of the subchannel, the measurement data comprising a device busy time value, wherein the device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel; and c) storing the obtained device busy time value in the device busy time field of the subchannel measurement block specified by the obtained address. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A computer program product for obtaining a block of I/O measurement data, the computer program product comprising a storage medium, readable by a processing circuit and storing instructions, for execution by the processing circuit, for performing a method comprising:
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a) directly accessing a subchannel measurement block without having to use a measurement block origin or measurement block index to obtain the address of the subchannel measurement block, the subchannel measurement block comprising a device busy time field; b) obtaining measurement data related to performance of an I/O operation of the subchannel, the measurement data comprising a device busy time value, wherein the device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel; and c) storing the obtained device busy time value in the device busy time field of the subchannel measurement block specified by the obtained address. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24)
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Specification