Method of repairing micromirrors in spatial light modulators

• US 7,375,873 B2
• Filed: 02/28/2005
• Issued: 05/20/2008
• Est. Priority Date: 02/28/2005
• Status: Active Grant

• Current Assignee: Texas Instruments, Inc.
• Original Assignee: Texas Instruments, Inc.
• Inventors: Richards, Peter, Combes, Michel, Patel, Satyadev, Dunphy, James
• Primary Examiner(s): Stultz; Jessica T
• Application Number:
  US11/069,408
• Publication Number:
  US 20060193029A1
• Time in Patent Office: 1,177 Days
• Field of Search: 359/290, 359/291, 359/292, 359/295, 359/223
• US Class Current: 359/291
• CPC Class Codes: G02B 26/0841 the reflecting element being moved or deformed by electrostatic means

Abstract

Disclosed herein is method of operating a device that comprises an array of micromirrors. The method comprises a process usable for repairing stuck micromirrors of the micromirror array during the operation. The reparation process applies, at the ON state, two consecutive refresh voltages to the mirror plates of the micromirrors in the array with the pulses being separated in time longer than the characteristic oscillation time of the micromirrors. The reparation process can be applied independently to the micromirrors. Alternatively, the reparation process can be incorporated with a bias inversion process.

Claims

1. A method of operating a device comprising an array of micromirrors, each comprising a mirror plate and an addressing electrode, the method comprising:

switching the micromirrors between an ON and OFF state;

applying a number of refresh voltage pulses to the mirror plates so as to repair a stuck micromirror; and

wherein a ratio of the number of switches of the micromirrors between the ON and OFF states to the number of refresh voltage pulses is greater than 1.

2. The method of claim 1, wherein the step of switching the micromirrors between the ON and OFF states further comprises:

applying a bias voltage to the mirror plates of the micromirrors and a set of voltages to the addressing electrodes, wherein the voltages on the addressing electrodes are determined according to a set of image data produced from an image using a pulse-width-modulation technique.

3. The method of claim 2, further comprising:

applying the bias voltage to the mirror plate and a voltage to the addressing electrode associated with said mirror plate such that the mirror plate is rotated to an ON state angle of 10°

degrees or more from a non-deflected state, wherein the difference between said two voltages is 30 volts or more.

4. The method of claim 3, wherein the ON state angle is 12°

degrees or more relative to the non-deflected state.

5. The method of claim 3, further comprising:

adjusting at least one of the applied bias voltage and the voltage on the addressing electrode such that the voltage difference between the mirror plate and addressing electrode is 17 volts or less.

6. The method of claim 3, wherein the voltage on the addressing electrode changes 10 volts or more when the mirror plate switches between the ON and OFF states.

7. The method of claim 6, wherein the change of the voltage on the addressing electrode is from 13 to 25 volts when the mirror plate switches between the ON and OFF states.

8. The method of claim 1, wherein the step of applying a set of refresh voltage pulses further comprises:

performing a reparation process that comprises first and second refresh voltage pulses for the micromirrors, wherein the first and second refresh voltage pulses are spaced in time longer than the intrinsic oscillation time of the micromirror.

9. The method of claim 8, wherein the reparation process further comprises:

adjusting the bias voltage and the voltages on the addressing electrodes such that the micromirrors are expected to be in the OFF state; and

applying the first and second refresh voltage pulses to repair a stuck micromirror in the ON state.

10. The method of claim 8, wherein the reparation process is performed at most once during each frame period of a sequence of frames.

11. The method of claim 8, wherein the reparation process is performed during selected frames of the sequence of frames.

12. The method of claim 10, wherein the reparation process is performed at the end of the frame period.

13. The method of claim 8, wherein the reparation process is performed during a spoke time period intervening two of a sequence of color field periods.

14. The method of claim 13, wherein the first and second refresh pulses of the reparation process have opposite polarities.

15. The method of claim 14, wherein the polarization of the first refresh voltage pulse is opposite to the polarity of the bias voltage.

16. The method of claim 1, wherein the mirror plate comprises a metallic reflecting layer and a non-metallic layer, and each mirror plate is attached to a deformable hinge that comprises an electric conductive layer and a non-metallic layer;

and wherein the deformable hinge deforms under the refresh voltage pulses so as to produce a restoration energy when the mirror plate is at the OFF state.

17. The method of claim 8, further comprising:

changing the polarity of the bias voltage.

18. The method of claim 17, further comprising:

changing the bias voltage from first value to second value, wherein the micromirror is expected to be at the OFF state with the second value of the bias voltage;

maintaining the bias voltage at the second value for a transition time period where the mirror plates at the ON state are expected to be at the OFF state; and

performing the reparation process during said transition time period.

19. The method of claim 8, wherein the reparation process lasts for a time period of 10 microseconds or less.

20. The method of claim 8, wherein the reparation process lasts for a time period of 1 microsecond or less.