×

Row circuit ring oscillator method for evaluating memory cell performance

  • US 7,376,001 B2
  • Filed: 10/13/2005
  • Issued: 05/20/2008
  • Est. Priority Date: 10/13/2005
  • Status: Active Grant
First Claim
Patent Images

1. A method for measuring characteristics of a memory array, said method comprising:

  • enabling a cascade of memory cells of a particular row of said memory array, wherein said memory cells form a ring oscillator having a frequency dependent on a loading provided by other rows of memory cells in said memory array;

    measuring a frequency of oscillation of said ring oscillator in order to determine a characteristic of said memory array; and

    adjusting a leakage present at outputs of said memory cell by changing a state of said other memory cells within said memory array, and wherein said measuring is performed for multiple leakage states selected by said adjusting, whereby said method determines an effect of said leakage on said frequency.

View all claims
  • 9 Assignments
Timeline View
Assignment View
    ×
    ×