In-situ large area optical strain measurement using an encoded dot pattern

• US 7,377,181 B2
• Filed: 03/10/2006
• Issued: 05/27/2008
• Est. Priority Date: 03/10/2006
• Status: Active Grant

• Current Assignee: Northrop Grumman Systems Corporation (Northrop Grumman Corporation)
• Original Assignee: Northrop Grumman Corporation
• Inventors: Nardiello, Jerrell Anthony, Papazian, John M., Madsen, John Steven, Christ, Robert J. Jr.
• Primary Examiner(s): Lefkowitz; Edward
• Assistant Examiner(s): Kirkland, III; Freddie
• Application Number:
  US11/373,353
• Publication Number:
  US 20070209447A1
• Time in Patent Office: 809 Days
• Field of Search: 738/00, 356/32, 356/35.5, 356/330, 356/373, 356/394
• US Class Current: 73/800
• CPC Class Codes: G01L 1/247 using distributed sensing elements, e.g. microcapsules along a single optical fibre G01L1/242

Abstract

A method of measuring strain in a test specimen comprises the steps of placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, using the sets of coded marks to identify locations of at least two of the target marks, and using a change in distance between at least two of the marks to determine strain in the test specimen. An apparatus that performs the method is also provided.

Claims

1. A method of measuring strain in a test specimen, the method comprising the steps of:

placing a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, each set of coded marks defining a code that identifies a location of one of the target marks;

using the sets of coded marks to identify locations of at least two of the target marks; and

using a change in distance between at least two of the marks to determine strain in the test specimen.

2. The method of claim 1, wherein the coded marks are coded with a binary code representative of the location of the target marks.

3. The method of claim 1, wherein the coded marks are coded by color, size, shape or shade.

4. The method of claim 1, wherein the pattern of marks forms a two-dimensional array of marks.

5. The method of claim 1, wherein the pattern of marks forms a three-dimensional array of marks.

6. The method of claim 1, further comprising the steps of:

capturing a base image of the pattern of marks; and

identifying locations of at least two of the target marks in the base image.

7. The method of claim 1, wherein the size of the target marks differs from the size of the coded marks.

8. An apparatus comprising:

a pattern of marks on a surface of the test specimen, wherein the pattern of marks includes a plurality of target marks and a plurality of sets of coded marks, each set of coded marks defining a code that identifies a location of one of the target marks;

a sensor for detecting the pattern of marks; and

a processor for using the coded marks to determine locations of at least two of the target marks, for measuring changes in distance between at least two of the marks, and for calculating strain in the test specimen based on the changes in distance.

9. The apparatus of claim 8, wherein the coded marks are coded with a binary code representative of the location of the target marks.

10. The apparatus of claim 8, wherein the coded marks are coded by color, size, shape or shade.

11. The apparatus of claim 8, wherein the pattern of marks forms a two-dimensional array of marks.

12. The apparatus of claim 8, wherein the pattern of marks forms a three-dimensional array of marks.

13. The apparatus of claim 8, further comprising:

a video camera for capturing images of the pattern of marks.

14. The apparatus of claim 8, wherein the size of the target marks differs from the size of the coded marks.