Flip chip metallization method and devices
First Claim
Patent Images
1. A method of interconnect metallization for an electronic device having electrical contacts exposed through a passivation layer, comprising the steps of:
- a) depositing an adhesion layer on the electrical contacts, the adhesion layer including titanium;
b) depositing a diffusion barrier layer on the adhesion layer, the diffusion barrier layer including platinum;
c) depositing a wetable layer on the diffusion barrier layer, the wetable layer including gold; and
d) depositing a wetting stop layer on a portion of the wetable layer, the wetting stop layer including titanium and tungsten.
4 Assignments
0 Petitions
Accused Products
Abstract
Interconnect metallization schemes and devices for flip chip bonding are disclosed and described. Metallization schemes include an adhesion layer, a diffusion barrier layer, a wetable layer, and a wetting stop layer. Various thicknesses and materials for use in the different layers are disclosed and are particularly useful for metallization in implantable electronic devices such as neural electrode arrays.
-
Citations
20 Claims
-
1. A method of interconnect metallization for an electronic device having electrical contacts exposed through a passivation layer, comprising the steps of:
-
a) depositing an adhesion layer on the electrical contacts, the adhesion layer including titanium; b) depositing a diffusion barrier layer on the adhesion layer, the diffusion barrier layer including platinum; c) depositing a wetable layer on the diffusion barrier layer, the wetable layer including gold; and d) depositing a wetting stop layer on a portion of the wetable layer, the wetting stop layer including titanium and tungsten. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
-
-
14. A device compatible with flip chip bonding, comprising:
-
a) an electronic device having a plurality of electrical interconnects disposed in a planar array and exposed through a passivation layer; and b) an underbump metallization stack disposed on at least one exposed electrical interconnect, the underbump metallization stack comprising; i) an adhesion layer disposed on the electrical interconnect, the adhesion layer including titanium; ii) a diffusion barrier disposed over the adhesion layer, the diffusion layer include platinum; iii) a wetable layer disposed over the diffusion layer, the wetable layer including gold; and iv) a wetting stop layer disposed over the wetable layer, the wetting stop layer including titanium and tungsten. - View Dependent Claims (15, 16, 17, 18, 19, 20)
-
Specification