Apparatus and method for detecting photon emissions from transistors
First Claim
1. A method of processing an integrated circuit CAD database for use in testing the integrated circuit with an imaging optical detector comprising:
- identifying the location of at least one transistor in the integrated circuit CAD database;
processing the integrated circuit CAD database to define at least one photon detection location as a function of the location of the at least one transistor; and
,wherein the operation of identifying the locations of the at least one transistor in the integrated circuit CAD database comprises identifying a location of a gate associated with the at least one transistor.
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Abstract
A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.
73 Citations
37 Claims
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1. A method of processing an integrated circuit CAD database for use in testing the integrated circuit with an imaging optical detector comprising:
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identifying the location of at least one transistor in the integrated circuit CAD database; processing the integrated circuit CAD database to define at least one photon detection location as a function of the location of the at least one transistor; and
,wherein the operation of identifying the locations of the at least one transistor in the integrated circuit CAD database comprises identifying a location of a gate associated with the at least one transistor. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A method of processing an integrated circuit CAD database for use in testing the integrated circuit with an imaging optical detector comprising:
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identifying the location of at least one transistor in the integrated circuit CAD database; processing the integrated circuit CAD database to define at least one photon detection location as a function of the location of the at least one transistor; and
,wherein the at least one photon detection location comprises a generally rectangular photon emission detection window. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26)
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27. A method of processing an integrated circuit CAD database for use in testing the integrated circuit with an imaging optical detector comprising:
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identifying the location of at least one transistor in the integrated circuit CAD database; processing the integrated circuit CAD database to define at least one photon detection location as a function of the location of the at least one transistor; and
,characterizing the operation of an integrated circuit as a function of the at least one photon detection location. - View Dependent Claims (28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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Specification