Wireless functional testing of RFID tag

• US 7,400,255 B2
• Filed: 02/28/2005
• Issued: 07/15/2008
• Est. Priority Date: 02/28/2005
• Status: Active Grant

• Current Assignee: Impinj, Inc.
• Original Assignee: Impinj, Inc.
• Inventors: Horch, Andrew E.
• Primary Examiner(s): MULLEN, THOMAS J
• Application Number:
  US11/069,515
• Publication Number:
  US 20060206277A1
• Time in Patent Office: 1,233 Days
• Field of Search: 340/572.7, 340/572.4, 340/572.1, 340/10.1, 340/505, 235/438, 295/93, 324/500, 324/537, 324/765, 714/724, 702/117
• US Class Current: 340/572.7
• CPC Class Codes: B07C 5/344 according to electric or electromagnetic properties sorting according to size measured electrically or electronically B07C5/08; material testing by magnetic means G01N24/00, G01N27/00, by electrical means G01N27/00; electrical measuring devices in general G01R; coin testing G07D5/00
• CPC Class Codes: G01R 31/01 Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: H01L 2223/6677 for antenna, e.g. antenna included within housing of semiconductor device
• CPC Class Codes: Y10T 29/49004 including measuring or testing of device or component part

Abstract

Wirelessly testing an RFID tag before it is packaged or otherwise entered into a process reserved for “working” RFID tags is described. Various processes that employ such wireless testing as well as various “on-die” RFID tag antenna designs for facilitating the wireless testing are also described.

Claims

1. A method, comprising:

transmitting a wireless signal to a circuit die for a RFID tag, while said circuit die'"'"'s positioning is under the control of a machine that transports said circuit die, to administer a functional test to said circuit die, said circuit die having an on-die antenna adapted to receive said wireless signal.

2. The method of claim 1 further comprising:

obtaining one of a plurality of possible results of said functional test;

selecting a distinct location from amongst a plurality of distinct locations, said selected distinct location corresponding to said obtained result;

placing said circuit die in said selected distinct location.

3. The method of claim 2 wherein said selected distinct location is where scrap circuit dies are placed, said circuit die deemed to have failed said functional test.

4. The method of claim 2 wherein said selected distinct location is where circuit dies to be packaged are placed, said circuit die deemed to have passed said functional test.

5. The method of claim 4 further comprising packaging said circuit die after said placing.

6. The method of claim 4 further comprising:

transmitting a second wireless signal to a second circuit die for an RFID tag, while said second circuit die is in the grasp of said machine, to administer a second functional test to said second circuit die, said second circuit die having an on-die antenna adapted to receive said second wireless signal;

determining that said second circuit die has failed said second functional test; and

,

placing said second circuit die in a second distinct location, said second distinct location being where scrap circuit dies are placed.

7. The method of claim 2 wherein said selected distinct location is where circuit dies to be used are placed, said RFID tag deemed to have passed said functional test.

8. The method of claim 2 wherein said selected distinct location is a starting location for a packaging process that packages said circuit die, said circuit die deemed to have passed said functional test.

9. The method of claim 2 wherein said selected distinct location is where circuit dies that are deemed marginally acceptable are placed, said circuit die deemed to have marginally passed said functional test.

10. The method of claim 1 wherein said machine is a pick-and-place machine.

11. The method of claim 10 wherein said transmitting a wireless signal further comprises transmitting a wireless signal from an antenna that is attached to said pick-and-place machine.

12. The method of claim 10 wherein other circuit dies yet to be picked and that were manufactured from a same wafer that said circuit die was manufactured from are not functionally tested with said wireless signal, said circuit die being closer than said other circuit dies to an antenna that transmits said wireless signal.

13. The method of claim 1 wherein other circuit dies yet to be picked and that were manufactured from a same wafer that said circuit die was manufactured from are not functionally tested with said wireless signal, said circuit die being closer than said other circuit dies to an antenna that transmits said wireless signal during said administering of said functional test.

14. The method of claim 1 wherein said circuit die has a die seal ring and said circuit die'"'"'s on-die antenna is electrically isolated from said circuit die'"'"'s die seal ring.

15. The method of claim 1 wherein said circuit die has an active device area and said circuit die'"'"'s on-die antenna is electrically integrated with a stacked metallic structure, said stacked metallic structure to thwart penetration of contaminants into said circuit die'"'"'s active device area.

16. The method of claim 15 wherein said stacked metallic structure comprises a wire, a bar contact and a bar via.

17. An apparatus, comprising:

a pick-and-place machine to pick a circuit die for an RFID tag and place said circuit die at a location, said circuit die having an on-die antenna; and

,

a functional tester having an antenna, said antenna to transmit a wireless signal used to functionally test said circuit die while said circuit die is in the grasp of said pick-and-place machine.

18. The apparatus of claim 17 wherein said pick-and-place machine places said circuit die at said location via a trajectory, said functional tester being situated independently of said pick-and-place machine and having its antenna situated so as to test said circuit die while said circuit die passes a point along said trajectory.

19. The apparatus of claim 17 wherein said functional tester'"'"'s antenna is attached to said pick-and-place machine.

20. The apparatus of claim 17 wherein said circuit die has a die seal ring and said circuit die'"'"'s on-die antenna is electrically isolated from said circuit die'"'"'s die seal ring.

21. The apparatus of claim 17 wherein said circuit die has an active device area and said circuit die'"'"'s on-die antenna is electrically integrated with a stacked metallic structure, said stacked metallic structure to thwart penetration of contaminants into said circuit die'"'"'s active device area.

22. A method, comprising:

a) picking a circuit die for an RFID tag from amongst a plurality of circuit dies manufactured from a same wafer, said circuit die having an on-die antenna;

b) transmitting a wireless signal to said circuit die to administer a functional test to said circuit die;

c) determining that said circuit die passed said functional test; and

,

d) packaging said circuit die.

23. The method of claim 22 wherein said transmitting a wireless signal further comprises transmitting a wireless signal from an antenna that is attached to a pick-and-place machine that performs said picking.

24. The method of claim 22 wherein other circuit dies yet to be picked from said wafer are not functionally tested with said wireless signal, said circuit die being closer than said other circuit dies to an antenna that transmits said wireless signal.

25. The method of claim 22 wherein said circuit die has a die seal ring and said circuit die'"'"'s on-die antenna is electrically isolated from said circuit die'"'"'s die seal ring.

26. The method of claim 22 wherein said circuit die has an active device area and said circuit die'"'"'s on-die antenna is electrically integrated with a stacked metallic structure, said stacked metallic structure to thwart penetration of contaminants into said circuit die'"'"'s active device area.

27. The method of claim 22 wherein said circuit die has a stacked metallic structure and said stacked metallic structure comprises a bar contact and a bar via.