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Test structure and probe for differential signals

  • US 7,403,028 B2
  • Filed: 02/22/2007
  • Issued: 07/22/2008
  • Est. Priority Date: 06/12/2006
  • Status: Expired due to Fees
First Claim
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1. A test structure for testing a functionality of a transistor, said test structure comprising:

  • (a) a first transistor including;

    (i) a first terminal connectible through a first resistance to a source of a first component of a differential signal;

    (ii) a second terminal connectible through a second resistance to a sink for a first component of an output signal and interconnected to said first terminal by a parasitic capacitance; and

    (iii) a third terminal;

    (b) a second transistor including;

    (i) a first terminal connectible through a third resistance to a source of a second component of a differential signal;

    (ii) a second terminal connectible through a fourth resistance to a sink for a second component of an output signal and interconnected to said first terminal by a parasitic capacitance; and

    (iii) a third terminal interconnected with said third terminal of said first transistor and a source of a bias voltage;

    (c) a first compensating capacitor connecting said first terminal of said first transistor to said second terminal of said second transistor; and

    (d) a second compensating capacitor connecting said first terminal of said second transistor to said second terminal of said first transistor.

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