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Automatic scanning parameter setting device and method

  • US 7,403,313 B2
  • Filed: 09/27/2001
  • Issued: 07/22/2008
  • Est. Priority Date: 09/27/2001
  • Status: Active Grant
First Claim
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1. A system, comprising:

  • an analysis device adapted to analyze one or more scan images to identify one or more scan parameter values included in at least a portion of the scan images and compare the identified scan parameter values to a library of scan parameter values to obtain one or more scanner settings corresponding with the identified scan parameter values, wherein the scan images include a specified set parameter format having an initial label and an end label and the scanning parameter values are located between the initial label and the end label; and

    a control unit electrically coupled to the analysis device and adapted to provide said scanner settings to a scanning device.

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