×

Automated test and characterization data analysis methods and arrangement

  • US 7,404,123 B1
  • Filed: 08/03/2006
  • Issued: 07/22/2008
  • Est. Priority Date: 03/28/2005
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method for testing a first component configured to be installed in a plasma processing system that is controlled during production with a production system control software, comprising:

  • providing an ATAC (Automated Test and Characterization) fixture, said ATAC fixture including at least;

    a first system control software package (“

    first SCS”

    ) that is representative of said production system control software,a data manager module configured to obtain specification data from a first database over a computer network,a test manager module configured to execute, using said first SCS, a set of tests designed to test said component,a SCS interface engine configured to provide at least said set of tests to said first SCS, anda data analysis module configured to provide computer-implemented data analysis tool to a user for analyzing test data obtained from said testing said first component; and

    coupling said ATAC fixture to said first component to enable said first SCS in said ATAC fixture to test said first component utilizing said set of tests and at least a portion of said specification data, wherein missing components of said plasma processing system which are not present while testing said first component are stubbed out to simulate said missing components, thereby permitting said first component to be tested in a simulated environment using said first SCS as if said missing components are present while testing said first component.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×