System and method for estimating reliability of components for testing and quality optimization

• US 7,409,306 B2
• Filed: 03/06/2007
• Issued: 08/05/2008
• Est. Priority Date: 10/19/2001
• Status: Expired due to Fees

• Current Assignee: Auburn University
• Original Assignee: Auburn University
• Inventors: Singh, Adit D., Barnett, Thomas S.
• Primary Examiner(s): TSAI, CAROL S W
• Application Number:
  US11/715,172
• Publication Number:
  US 20070162242A1
• Time in Patent Office: 518 Days
• Field of Search: 702/117, 702/118, 702/179, 702/81, 702/181, 702/182, 702/82, 702/35, 702/33, 702/34, 702/83, 702/84, 714/755, 250/559.45, 324/158.1, 324/765, 700/109, 700/110, 700/11, 700/121, 257/E21.525, 706/904, 706/906, 706/912, 706/914, 706/921
• US Class Current: 702/81
• CPC Class Codes: G01R 31/287 Procedures; Software aspects
• CPC Class Codes: H01L 22/20 Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps

Abstract

A system and method for determining the early life reliability of an electronic component, including classifying the electronic component based on an initial determination of a number of fatal defects, and estimating a probability of latent defects present in the electronic component based on that classification with the aim of optimizing test costs and product quality.

Claims

1. A method of determining the reliability of a component, the method comprising:

classifying the component based on an initial determination of a number of fatal defects; and

estimating a probability of latent defects present in the component based on the classification, by integrating yield information based on the initial determination of a number of fatal defects using a statistical defect-clustering model.

2. The method of claim 1, wherein the step of classifying the component based on an initial determination of a number of fatal defects comprises determining a number of neighboring components having fatal defects.

3. The method of claim 1, wherein the step of estimating a probability of latent defects present in the component based on the classification comprises testing a sample of components from fewer than all of a plurality of classifications.

4. The method of claim 3, wherein the step of estimating a probability of latent defects present in the component based on the classification comprises testing a sample of components from one of a plurality of classifications.

5. The method of claim 4, wherein the one of a plurality of classifications from which a sample is tested is a classification corresponding to a maximum number of neighboring components having fatal defects.

6. The method of claim 2, wherein the number of neighboring components having fatal defects is determined from a neighborhood of immediately neighboring components.

7. The method of claim 6, wherein the neighborhood of immediately neighboring components comprises eight neighboring components surrounding a subject component.

8. The method of claim 1, wherein the step of classifying the component based on an initial determination of a number of fatal defects comprises determining a number of repairs carried out on a repairable electronic component.

9. The method of claim 8, wherein the step of estimating a probability of latent defects present in the component based on the classification comprises testing a sample of components from fewer than all of a plurality of classifications.

10. The method of claim 9, wherein the step of estimating a probability of latent defects present in the component based on the classification comprises testing a sample of components from one of a plurality of classifications.

11. The method of claim 10, wherein the one of a plurality of classifications from which a sample is tested is a classification corresponding to a maximum number of repairs carried out on the component.

12. The method of claim 8, wherein the step of classifying the component based on an initial determination of a number of fatal defects further comprises determining a number of repairs carried out on a neighboring component.

13. The method of claim 1, wherein the step of estimating a probability of latent defects present in the component based on the classification comprises determining a ratio of fatal defects to latent defects.

14. The method of claim 1, further comprising optimizing subsequent testing of the component based on an estimated reliability of the component.

15. The method of claim 1, further comprising testing the component if an estimated a probability of latent defects present in the component exceeds a specified rate.

16. The method of claim 1, wherein the step of classifying the component comprises separating a plurality of components into a plurality classifications.

17. The method of claim 16, further comprising statistically predicting the reliability of components in each of the plurality of classifications by testing a sample of components from fewer than all of the plurality of classifications.

18. The method of claim 1, wherein the component is a die for assembly into a multi-chip module, and wherein the method further comprises rejecting die determined to have a reliability below a specified rate.