System and method for repairing a memory
First Claim
1. A method of repairing a memory instance having a plurality (N) of main array column (MAC) portions and a redundancy array column (RAC) portion, wherein each of said MAC portions and said RAC portion is associated with a sense amplifier and write driver (SAWD) circuit block for operably coupling with one of N input/output (I/O) blocks provided for said memory instance, comprising:
- detecting that one of said MAC portions is faulty;
decoupling said faulty MAC portion'"'"'s SAWD circuit block from an I/O block associated therewith and shifting said faulty MAC portion'"'"'s I/O block to a SAWD circuit block associated with a MAC portion immediately next to said faulty MAC portion on a selected side thereof; and
successively shifting coupling relationships between SAWD circuit blocks and I/O blocks for each MAC portion disposed on said selected side of said faulty MAC portion until an I/O block associated with a MAC portion that is immediately next to said RAC portion is shifted to said RAC portion'"'"'s SAWD circuit block.
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0 Petitions
Accused Products
Abstract
A method and system for repairing a memory. A test and repair wrapper is operable to be integrated with input/output (I/O) circuitry of a memory instance to form a wrapper I/O (WIO) block that is operable to receive test and repair information from a built-in self-test and repair (BISTR) processor. Logic circuitry associated with the WIO block is operable generate a current error signal that is used locally by the BISTR processor for providing a repair enable control signal in order to repair a faulty memory portion using a redundant memory portion without having to access a post-processing environment for repair signature generation.
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Citations
14 Claims
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1. A method of repairing a memory instance having a plurality (N) of main array column (MAC) portions and a redundancy array column (RAC) portion, wherein each of said MAC portions and said RAC portion is associated with a sense amplifier and write driver (SAWD) circuit block for operably coupling with one of N input/output (I/O) blocks provided for said memory instance, comprising:
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detecting that one of said MAC portions is faulty; decoupling said faulty MAC portion'"'"'s SAWD circuit block from an I/O block associated therewith and shifting said faulty MAC portion'"'"'s I/O block to a SAWD circuit block associated with a MAC portion immediately next to said faulty MAC portion on a selected side thereof; and successively shifting coupling relationships between SAWD circuit blocks and I/O blocks for each MAC portion disposed on said selected side of said faulty MAC portion until an I/O block associated with a MAC portion that is immediately next to said RAC portion is shifted to said RAC portion'"'"'s SAWD circuit block. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A system for repairing a memory instance having a plurality (N) of main array column (MAC) portions and a redundancy array column (RAC) portion, wherein each of said MAC portions and said RAC portion is associated with a sense amplifier and write driver (SAWD) circuit block for operably coupling with one of N input/output (I/O) blocks provided for said memory instance, comprising:
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circuitry for detecting that one of said MAC portions is faulty; circuitry for decoupling said faulty MAC portion'"'"'s SAWD circuit block from an I/O block associated therewith and for shifting said faulty MAC portion'"'"'s I/O block to a SAWD circuit block associated with a MAC portion immediately next to said faulty MAC portion on a selected side thereof; and circuitry for successively shifting coupling relationships between SAWD circuit blocks and I/O blocks for each MAC portion disposed on said selected side of said faulty MAC portion until an I/O block associated with a MAC portion that is immediately next to said RAC portion is shifted to said RAC portion'"'"'s SAWD circuit block. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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Specification