Sapphire alignment fixture

• US 7,421,795 B2
• Filed: 08/04/2006
• Issued: 09/09/2008
• Est. Priority Date: 08/04/2006
• Status: Expired due to Fees

• Current Assignee: Seagate Technology LLC (Seagate Technology Holdings Plc)
• Original Assignee: Seagate Technology LLC (Seagate Technology Holdings Plc)
• Inventors: Gonzalez, Steve G., Mysore, Ananda V.
• Primary Examiner(s): Fulton; Christopher W
• Application Number:
  US11/498,832
• Publication Number:
  US 20080028627A1
• Time in Patent Office: 767 Days
• Field of Search: 335/68
• US Class Current: 33/568
• CPC Class Codes: G01B 1/00 Measuring instruments characterised by the selection of material therefor
• CPC Class Codes: G01B 5/0004 Supports G01B5/025 takes precedence
• CPC Class Codes: G01B 5/25 for testing the alignment of axes

Abstract

A metrology system comprises a support structure, a fixture having a bottom surface resting on a surface of the support structure and moveable relative to the support structure, and a first measurement assembly for interacting with a workpiece held by the fixture to measure a characteristic of the workpiece. One of the bottom surface of the fixture and the surface of the support structure comprises sapphire, and the other of the bottom surface of the fixture and the surface of the support structure comprises a metal.

Claims

1. A method for measuring a characteristic of a workpiece, comprising:

loading a workpiece into a fixture that rests on a support structure, wherein interfacing surfaces of the fixture and the support structure have a coefficient of friction in a certain range;

moving the workpiece and a first measurement assembly relative to each other so that the workpiece is aligned with the first measurement assembly;

moving a component of the first measurement assembly to contact the workpiece to obtain a first measurement of a characteristic of the workpiece, wherein when the component contacts the workpiece, the fixture is adapted to slide on the support structure in response to a force exerted on the workpiece and the fixture by the component; and

receiving and calculating the first measurement of the characteristic of the workpiece.

2. The method of claim 1, wherein the bottom surface of the fixture comprises sapphire and the surface of the support structure comprises a metal.

3. The method of claim 1, wherein the bottom surface of the fixture is detachable.

4. The method of claim 1, further comprising a second measurement assembly for measuring a characteristic of a workpiece held by the fixture.

5. The method of claim 4, wherein the workpiece includes a conical cavity, and the first and second measurement assemblies are adapted to measure an angle of taper of the conical cavity.

6. The method of claim 4, wherein the support structure comprises a base, a stage guide, and a stage.

7. The method of claim 6, wherein the stage moves relative to the stage guide to position the workpiece and the fixture properly with respect to the second measurement assembly before the measurement assembly measures a characteristic of the workpiece.

8. The method of claim 4, further comprising data acquisition logic to receive and process the characteristic measured by the first and second measurement assemblies.

9. The method of claim 1, wherein the workpiece comprises metal and a surface of the fixture abuts the workpiece and comprises sapphire.

10. The method of claim 1, wherein the support structure comprises a base, a stage guide, and a stage.

11. The method of claim 10, wherein the stage is adapted to move relative to the stage guide to position the workpiece and the fixture properly with respect to the first measurement assembly before the measurement assembly measures a characteristic of the workpiece.

12. The method of claim 1, further comprising moving the workpiece and a second measurement assembly relative to each other so that the workpiece is aligned with the second measurement assembly;

and

moving a component of the second measurement assembly to contact the workpiece to obtain a second measurement of the characteristic of the workpiece, wherein when the component of the second measurement assembly contacts the workpiece, the fixture is adapted to slide on the support structure in response to a force exerted on the workpiece and the fixture by the component of the second measurement assembly.

13. The method of claim 12, further comprising receiving and calculating the second measurement of the characteristic of the workpiece.

14. The method of claim 1, wherein interfacing surfaces of the workpiece and the fixture have a coefficient of friction of less than about 0.15.

15. The method of claim 14, wherein one of the interfacing surfaces comprises sapphire and the other of the interfacing surfaces comprises a metal.

16. The method of claim 15, wherein the metal is a polished steel.

17. The method of claim 1, wherein interfacing surfaces of the fixture and the support structure have a coefficient of friction of less than about 0.15.

18. The method of claim 17, wherein one of the interfacing surfaces comprises sapphire and the other of the interfacing surfaces comprises a metal.

19. The method of claim 1, further comprising data acquisition logic to receive and process the characteristic measured by the first measurement assembly.

20. The method of claim 1, wherein a surface of the fixture that abuts the workpiece to hold the workpiece comprises sapphire.