Tag testing device, tag testing method, and tag testing program

• US 7,425,896 B2
• Filed: 11/22/2005
• Issued: 09/16/2008
• Est. Priority Date: 03/29/2005
• Status: Expired due to Fees

• Current Assignee: Fujitsu Frontech Limited (Fujitsu Limited), Fujitsu Limited
• Original Assignee: Fujitsu Frontech Limited (Fujitsu Limited), Fujitsu Limited
• Inventors: Kawamata, Hiroshi
• Primary Examiner(s): Bugg; George A
• Assistant Examiner(s): Pham; Lam P
• Application Number:
  US11/283,839
• Publication Number:
  US 20060220858A1
• Time in Patent Office: 1,029 Days
• Field of Search: 340/572.1, 340/572.8, 340/514, 340/584, 340/588, 340/589, 340/655, 324/500, 324/512, 374 9- 11, 374120-121, 235/385, 235/492, 714/25, 714/32
• US Class Current: 340/572.1
• CPC Class Codes: G01R 31/2822 of microwave or radiofrequency circuits of attenuation, gain, e.g. using network analyzers G01R27/28
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence

Abstract

A tag testing device uses an infrared camera to take an image of a plurality of radio frequency identification tags, compares the image with a stored standard tag pattern image storage, and detects defective tags based on the comparison. A radio wave transceiver bulk reads the tags using anti-collision, a tag response counter counts a number of tag responses, and a defective tag detector compares a number of heat emitting tags based upon the image processing with a number of tag responses counted by the tag response counter. If the number of heat emitting tags does not match a number of responsive tags, a number of the tags tested are changed by partially shielding the tags and the radio wave transceiver repeatedly bulk reads the tags using the anti-collision function while a shielding range is gradually changed, thereby narrowing down other possible defective but heat emitting tags.

Claims

1. A tag testing device that exposes a plurality of non-contact IC tags to radio waves or electromagnetic waves and detects defective IC tags from the non-contact IC tags, the tag testing device comprising:

a transmitting unit that bulk transmits radio waves or electromagnetic waves to the non-contact IC tags; and

a detecting unit that detects defective non-contact IC tags according to a combination of heat emission status and the bulk radio waves or electromagnetic waves transceiving status of the non-contact IC tags.

2. The tag testing device according to claim 1, further comprising:

a recording unit that records a standard pattern image representing a non-defective heat emission pattern of the non-contact IC tags; and

an imaging unit that takes an image of a heat emission pattern of the non-contact IC tags that receive radio waves or electromagnetic waves transmitted by the transmitting unit, wherein

the detecting unit compares the standard pattern image recorded in the recording unit and the image of the heat emission pattern of the non-contact IC tags taken by the imaging unit to detect the defective IC tags.

3. The tag testing device according to claim 2, further comprising:

a receiving unit that receives responses of the non-contact IC tags to radio waves or electromagnetic waves transmitted by the transmitting unit;

a tag response counting unit that counts number of the defective IC tags based on the responses received by the receiving unit; and

an image processing unit that counts a number of the defective IC tags by analyzing the image of the heat emission pattern of the non-contact IC tags taken by the imaging unit, wherein

the detecting unit determines absence of defective IC tags other than the defective IC tags that are detected based on the heat emission pattern image of the non-contact IC tags, when a number counted by the tag response counting unit matches the number counted by the image processing unit.

4. The tag testing device according to claim 3, further comprising

a shielding unit that changes a number of the non-contact IC tags that are to be tested by partially shielding a testing area that includes the non-contact IC tags by using a movable shielding mechanism, wherein

the detecting unit instructs the shielding unit to change the number of non-contact IC tags that are to be tested, when the number counted by the tag response counting unit does not match the number counted by the image processing unit, and gradually excludes from the testing area a non-defective IC tag area wherein the number counted by the tag response counting unit matches the number counted by the image processing unit, to detect defective IC tags that emit heat but do not respond to radio waves or electromagnetic waves.

5. The tag testing device according to any one of claims 1 to 4, further comprising a printing unit that prints a label on the defective IC tag detected by the detecting unit to mark the defective IC tag as defective.

6. The tag testing device according to any one of claims 1 to 4, further comprising a cooling unit that cools a testing area that includes the non-contact IC tags that are to be tested.

7. A method, comprising:

determining heat emission status of a plurality of non-contact integrated circuit (IC) tags when bulk transmitting electromagnetic waves or radio waves to the tags;

determining bulk electromagnetic wave or radio wave transceiving status of the tags; and

detecting defective tags by identifying one or more positions of defective tags in a test area of the plurality of tags, according to a combination of heat emission status and the bulk electromagnetic wave or radio wave transceiving status.

8. The tag testing method according to claim 7, further comprising:

recording a standard pattern representing a non-defective heat emission pattern of the non-contact IC tags; and

taking an image of a heat emission pattern of the non-contact IC tags that receive the transmitted radio waves or electromagnetic waves, wherein

the detecting includes comparing the recorded standard pattern recorded and the taken image of the heat emission pattern of the non-contact IC tags to detect the defective IC tags.

9. The tag testing method according to claim 8, further comprising:

receiving responses of the non-contact IC tags to the transmitted radio waves or electromagnetic waves;

counting a number of the defective IC tags based on the responses received; and

counting a number of the defective IC tags by analyzing the taken image of the heat emission pattern of the non-contact IC tags, wherein

the detecting includes determining absence of defective IC tags other than the defective IC tags that are detected based on the heat emission pattern of the non-contact IC tags, when the number counted at the tag response counting matches the number counted by analyzing the taken image.

10. An apparatus performing the method of claim 7.

11. The method according to claim 7, wherein the determining of the heat emission status comprises thermography, temperature sensing, luminance, or any combinations thereof of a plurality of non-contact integrated circuit (IC) tags and detecting a defective tag from among the plurality of tags based upon the heat emission status when transmitting electromagnetic waves or radio waves to the tags.

12. A tag testing program of exposing a plurality of non-contact IC tags to radio waves or electromagnetic waves and detecting defective IC tags from the non-contact IC tags, wherein the program causes a computer to execute:

bulk transmitting radio waves or electromagnetic waves to the non-contact IC tags; and

detecting the defective IC tags according to a combination of heat emission status and the bulk radio waves or electromagnetic waves transceiving status of the non-contact IC tags.

13. An apparatus, comprising:

an infrared camera to take an image of a plurality of non-contact integrated circuit (IC) tags; and

a controller to simultaneously test the plurality of non-contact IC tags according to a combination of heat emission status detected based on the taken image and bulk electromagnetic wave or radio wave transceiving status of the non-contact IC tags.

14. The apparatus of claim 13, wherein the controller determines the heat emission status according to thermography by comparing the infrared camera image of the tags with a stored tag pattern image of functioning tags to detect a defective tag.

15. The apparatus of claim 14, wherein the controller bulk reads the tags using an anti-collision function, counts a number of tag responses, and compares a number of heat emitting tags based upon the heat emission status of the tags with a number of tag responses, to detect a position of the non-active tag with a proper heat emission status as the defective tag.

16. The apparatus of claim 15, further comprising:

a shield,

wherein, if the number of heat emitting tags does not match the number of responsive tag, the controller controls the shield to gradually change a tag test area exposed to the electromagnetic waves or radio waves and repeatedly bulk reads the tags using the anti-collision function to narrow down the position of the non-active tag with proper heat emission status as the defective tag.

17. The apparatus of claim 13, wherein the tags are passive radio frequency identification (RFID) tags on a tag sheet, encased active RFID tags, or any combinations thereof.

18. The apparatus of claim 13, wherein the heat emission status comprises a status based upon whether a tag fails to emit heat, emits excessive heat, emits insufficient heat, or any combinations thereof.

19. The apparatus of claim 18, wherein the controller determines the heat emission status according to thermography, temperature sensing, luminance, or any combinations thereof.

20. The apparatus of claim 16, wherein the shield is a movable shield movable in a random direction on a surface parallel to the tag test area, according to instructions from the controller.

21. The apparatus of claim 14, further comprising:

a computer readable medium storing a plurality of tag pattern images of functioning different type tags,

wherein the controller tests a plurality of different type tags according to thermography based upon the tag pattern images of functioning different type tags, to detect a defective tag.

22. An apparatus, comprising:

means for detecting a defective non-contact integrated circuit (IC) tag from among a plurality of non-contact IC tags according to a combination of heat emission status and bulk electromagnetic wave or radio wave transceiving status of the non-contact IC tags.

23. The apparatus of claim 22, further comprising:

means for detecting a position of a non-active tag with a proper heat emission status, as the defective tag.