Measuring temperature change in an electronic biomedical implant
First Claim
1. A method comprising:
- receiving a signal transmitted by an implantable electronic device, wherein a transmission frequency of the received signal corresponds to an output frequency associated with a non-crystal oscillator included in the implantable electronic device;
comparing the transmission frequency of the received signal with an initial value to detect a frequency shift; and
determining a change in temperature of the implantable electronic device based on the detected frequency shift.
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Accused Products
Abstract
The change in temperature of an implanted electronic device can be determined by providing power to one or more circuit elements included in the implanted electronic device, wherein the circuit elements comprise a non-crystal oscillator. A shift in the output frequency associated with the non-crystal oscillator can be detected, and the temperature change of the implanted electronic device can be determined based on the detected output frequency shift. One or more signals based on the output frequency associated with the non-crystal oscillator can be transmitted by the implanted electronic device. The transmitted signals can be received by an external device, which can detect the current output frequency associated with the non-crystal oscillator from the transmitted signals and compare the current output frequency with a previous output frequency to determine the output frequency shift associated with the non-crystal oscillator. The output frequency can, for example, be converted to a voltage measure.
74 Citations
23 Claims
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1. A method comprising:
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receiving a signal transmitted by an implantable electronic device, wherein a transmission frequency of the received signal corresponds to an output frequency associated with a non-crystal oscillator included in the implantable electronic device; comparing the transmission frequency of the received signal with an initial value to detect a frequency shift; and determining a change in temperature of the implantable electronic device based on the detected frequency shift. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A system for determining a change in temperature of an implantable electronic device, the system comprising:
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an implantable electronic device configured to transmit a signal, wherein a transmission frequency of the transmitted signal corresponds to an output frequency associated with a non-crystal oscillator included in the implantable electronic device; and an external controller including processor electronics configured to perform operations comprising; receiving the transmitted signal; comparing the transmission frequency of the transmitted signal with an initial value to detect a frequency shift; and determining a change in temperature of the implantable electronic device based on the detected frequency shift. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. A method comprising:
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providing power to a non-crystal oscillator associated with an implantable electronic device; detecting an output frequency associated with the non-crystal oscillator; comparing the detected output frequency with a stored output frequency value associated with the non-crystal oscillator to detect an output frequency shift; and determining a change in temperature of the implantable electronic device based on the detected output frequency shift. - View Dependent Claims (21, 22, 23)
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Specification