Method and arrangement for performing measurements of the topography of a surface by means of a thermal emission from the surface
First Claim
1. Method for performing measurements of a topography of a surface, such as the topography of an eye surface, wherein an image is projected onto said surface from at least one projection light source using projection means, wherein at least a fraction of light leaving the surface as a result of said projection is received using one or more receiving units, such as charged coupled device (CCD) based cameras, wherein measurement of said topography relates to surface mapping of said surface, wherein said topography of the surface is determined by analysis of said fraction of light leaving the surface, and wherein said fraction of light leaving the surface is comprised of light radiated by the surface due to thermal emission, characterised in that, said analysis for determining said topography of die surface is performed on said light radiated by the surface due to thermal emission.
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Accused Products
Abstract
Method and arrangement for performing measurements of the topography of a surface (20), such as topography of an eye surface (20), wherein projecting means (1, 12) for projecting an image onto said surface (20) comprises a projection light source (1), and wherein at least a fraction of light leaving the surface (20) as a result of said projection is received using one or more receiving units (31, 32), such as charged coupled device (CCD) based cameras. The topography of the surface (20) is determined by analysis of said fraction of light leaving the surface (20), due to thermal emission and the image projected onto the surface (20) is projected with light comprising a colour for which the surface (20) is opaque, such as infrared light.
33 Citations
31 Claims
- 1. Method for performing measurements of a topography of a surface, such as the topography of an eye surface, wherein an image is projected onto said surface from at least one projection light source using projection means, wherein at least a fraction of light leaving the surface as a result of said projection is received using one or more receiving units, such as charged coupled device (CCD) based cameras, wherein measurement of said topography relates to surface mapping of said surface, wherein said topography of the surface is determined by analysis of said fraction of light leaving the surface, and wherein said fraction of light leaving the surface is comprised of light radiated by the surface due to thermal emission, characterised in that, said analysis for determining said topography of die surface is performed on said light radiated by the surface due to thermal emission.
- 20. Arrangement for performing measurements of the topography of a surface, such as topography of an eye surface, wherein measurement of said topography relates to surface mapping of said surface, said arrangement comprising projection means, which projection means comprise M least one projection light source for projecting an image onto the surface, further comprising one or more receiving units for receiving at least a fraction of light leaving the surface as a result of said projection, such as charged coupled device (CCD) based cameras, and means for analysis of said fraction of light leaving the surface for determining the topography of the surface, characterised in that, said analysis means for determining the topography of the surface are arranged for analysing light radiated by the surface due to thermal emission.
Specification