Range mapping using speckle decorrelation
First Claim
1. A method for mapping, comprising:
- projecting a primary speckle pattern from an illumination assembly into a target region;
capturing a plurality of reference images of the primary speckle pattern at different, respective distances from the illumination assembly in the target region;
capturing a test image of the primary speckle pattern that is projected onto a surface of an object in the target region;
comparing the test image to the reference images so as to identify a reference image in which the primary speckle pattern most closely matches the primary speckle pattern in the test image; and
estimating a location of the object based on a distance of the identified reference image from the illumination assembly.
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Accused Products
Abstract
A method for mapping includes projecting a primary speckle pattern from an illumination assembly into a target region. A plurality of reference images of the primary speckle pattern are captured at different, respective distances from the illumination assembly in the target region. A test image of the primary speckle pattern that is projected onto a surface of an object in the target region is captured and compared to the reference images so as to identify a reference image in which the primary speckle pattern most closely matches the primary speckle pattern in the test image. The location of the object is estimated based on a distance of the identified reference image from the illumination assembly.
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Citations
14 Claims
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1. A method for mapping, comprising:
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projecting a primary speckle pattern from an illumination assembly into a target region; capturing a plurality of reference images of the primary speckle pattern at different, respective distances from the illumination assembly in the target region; capturing a test image of the primary speckle pattern that is projected onto a surface of an object in the target region; comparing the test image to the reference images so as to identify a reference image in which the primary speckle pattern most closely matches the primary speckle pattern in the test image; and estimating a location of the object based on a distance of the identified reference image from the illumination assembly. - View Dependent Claims (2, 3, 4, 5, 6)
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7. Apparatus for mapping, comprising:
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an illumination assembly, which is configured to project a primary speckle pattern into a target region; an imaging assembly, which is configured to capture a plurality of reference images of the primary speckle pattern at different, respective distances from the illumination assembly in the target region, and to capture a test image of the primary speckle pattern that is projected onto a surface of an object in the target region; and an image processor, which is coupled to compare the test image to the reference images so as to identify a reference image in which the primary speckle pattern most closely matches the primary speckle pattern in the test image, and to estimate a location of the object based on a distance of the identified reference image from the illumination assembly. - View Dependent Claims (8, 9, 10, 11, 12)
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- 13. A computer software product, comprising a computer-readable medium in which program instructions are stored, which instructions, when read by a computer, cause the computer to receive a plurality of reference images of the primary speckle pattern that is projected into a target region by an illumination assembly, wherein the reference images are captured at different, respective distances from the illumination assembly in the target region, and to receive a test image of the primary speckle pattern that is projected onto a surface of an object in the target region, and to compare the test image to the reference images so as to identify a reference image in which the primary speckle pattern most closely matches the primary speckle pattern in the test image, and to estimate a location of the object based on a distance of the identified reference image from the illumination assembly.
Specification