Semiconductor memory device capable of storing data of various patterns and method of electrically testing the semiconductor memory device
First Claim
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1. A method of electrically testing a semiconductor memory device, comprising:
- dividing a plurality of data input/output pads into a plurality of data input/output groups;
coupling a control signal generation pad to the data input/output pads;
outputting a control signal through the control signal generation pad;
enabling at least one data input/output pad of each data input/output group in response to the control signal;
writing non-identical data bits to neighboring memory cells of a memory cell array through the enabled data input/output pads; and
reading out the written data from the memory cell array.
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Abstract
A semiconductor memory device to which information of different data bits can be written, and a method of electrically testing the semiconductor memory device are provided. In a mode for testing a memory cell array of the semiconductor memory device, the semiconductor memory comprises a control signal generation pad capable of writing non-identical data to data input/output pads of each group when data is written to the memory cell array.
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12 Claims
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1. A method of electrically testing a semiconductor memory device, comprising:
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dividing a plurality of data input/output pads into a plurality of data input/output groups; coupling a control signal generation pad to the data input/output pads; outputting a control signal through the control signal generation pad; enabling at least one data input/output pad of each data input/output group in response to the control signal; writing non-identical data bits to neighboring memory cells of a memory cell array through the enabled data input/output pads; and reading out the written data from the memory cell array. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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Specification