Virtual test head for IC
First Claim
1. A method of testing a semiconductor device (DUT) using a tester, comprisinglocating the DUT in a first DUT socket mounted on a first board at a remote location remote from the tester, andproviding communication means for serially communicating between the tester and the DUT for transferring information between the tester and the DUT, the tester including a second DUT socket and an adaptor board located remotely from the first board, the adaptor board being adapted to be mounted on the second DUT socket and including a serializer-deserializer (SERDES) as part of the communication means.
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Accused Products
Abstract
In a test system for a semiconductor device, the device under test (DUT) is remotely located relative to the tester that generates the test vector signals. The tester and remotely located DUT are connected by a serial connection and each includes a serializer-deserializer for converting outgoing data to serial form and deserializing incoming data.
16 Citations
5 Claims
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1. A method of testing a semiconductor device (DUT) using a tester, comprising
locating the DUT in a first DUT socket mounted on a first board at a remote location remote from the tester, and providing communication means for serially communicating between the tester and the DUT for transferring information between the tester and the DUT, the tester including a second DUT socket and an adaptor board located remotely from the first board, the adaptor board being adapted to be mounted on the second DUT socket and including a serializer-deserializer (SERDES) as part of the communication means.
Specification