Semiconductor memory device
First Claim
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1. A semiconductor memory device comprising a matrix-like arrangement of memory elements in rows and columns, the semiconductor memory device comprising:
- a plurality of selection transistors, each selection transistor having two source/drain regions and an intervening channel controlled by a gate electrode, the selection transistors being arranged in rows and columns, said rows defined as being parallel to word lines and said columns defined as being parallel to bitlines;
a plurality of word lines, each word line being coupled to the gate electrodes of selection transistors arranged in a row;
a plurality of bit lines, each bit line being coupled to a respective source/drain region of a plurality of selection transistors arranged along said bit line, no two of said pairs arranged in the same row, wherein each selection transistor is coupled to precisely one bit line; and
a plurality of memory elements formed as resistance memory elements, each one of the memory elements being coupled to only one read/write line, and each memory element being further coupled between its respective read/write line and a source/drain region of a selection transistor that is not coupled to a bit line, wherein memory elements in adjacent columns along a read/write line are coupled to selection transistors that are coupled to different word lines.
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Abstract
A semiconductor memory device includes resistance memory elements that are coupled to selection transistors addressed by word lines and bit lines. The memory elements are read by read/write lines arranged parallel to the word lines. Two successive memory elements along a read/write line are coupled to selection transistors that are coupled to different word lines.
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Citations
20 Claims
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1. A semiconductor memory device comprising a matrix-like arrangement of memory elements in rows and columns, the semiconductor memory device comprising:
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a plurality of selection transistors, each selection transistor having two source/drain regions and an intervening channel controlled by a gate electrode, the selection transistors being arranged in rows and columns, said rows defined as being parallel to word lines and said columns defined as being parallel to bitlines; a plurality of word lines, each word line being coupled to the gate electrodes of selection transistors arranged in a row; a plurality of bit lines, each bit line being coupled to a respective source/drain region of a plurality of selection transistors arranged along said bit line, no two of said pairs arranged in the same row, wherein each selection transistor is coupled to precisely one bit line; and a plurality of memory elements formed as resistance memory elements, each one of the memory elements being coupled to only one read/write line, and each memory element being further coupled between its respective read/write line and a source/drain region of a selection transistor that is not coupled to a bit line, wherein memory elements in adjacent columns along a read/write line are coupled to selection transistors that are coupled to different word lines. - View Dependent Claims (17, 18)
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2. A semiconductor memory device comprising a matrix-like arrangement of memory elements in rows and columns, the semiconductor memory device comprising:
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a plurality of selection transistors, each selection transistor having two source/drain regions and an intervening channel controlled by a gate electrode, the selection transistors being arranged in rows and columns, said rows parallel to word lines and said columns parallel to bit lines; a plurality of word lines, each word line being coupled to the gate electrodes of the selection transistors in a respective row; a plurality of bit lines, each bit line being coupled to a respective source/drain region of a plurality of selection transistors, no two of which are arranged in the same row, wherein each selection transistor is coupled to precisely one bit line; and a plurality of memory elements formed as resistance memory elements, the memory elements being coupled row by row to read/write lines, each memory element being coupled between a respective read/write line and a source/drain region of a selection transistor that is not coupled to a bit line, wherein two successive memory elements along a read/write line are coupled to selection transistors that are coupled to different word lines wherein; the totality of the memory elements is divided into groups comprising the same number of memory elements; no two memory elements of the same group are coupled to the same read/write line; all the memory elements of the same group are coupled to the same selection transistor; the totality of the read/write lines are divided into groups, each group comprising as many read/write lines as there are memory elements coupled to a respective selection transistor; and each group of read/write lines is coupled to groups of memory elements, such that, from all the groups of memory elements of which a memory element is coupled to one read/write line of said group, each memory element is coupled to another read/write line of said group. - View Dependent Claims (3, 4, 5, 6)
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7. A semiconductor memory device comprising a matrix-like arrangement of memory elements in rows and columns, the semiconductor memory device comprising:
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a plurality of selection transistors, each selection transistor having two source/drain regions and an intervening channel controlled by a gate electrode, the selection transistors being arranged in rows and columns, said rows parallel to word lines and said columns parallel to bit lines; a plurality of word lines, each word line being coupled to the gate electrodes of the selection transistors in a respective row; a plurality of bit lines, each bit line being coupled to a respective source/drain region of a plurality of selection transistors, no two of which are arranged in the same row, wherein each selection transistor is coupled to precisely one bit line; a plurality of memory elements formed as resistance memory elements, the memory elements being coupled row by row to read/write lines, each memory element being coupled between a respective read/write line and that source/drain region of a selection transistor that is not coupled to a bit line, wherein two successive memory elements along a read/write line are coupled to selection transistors that are coupled to different word lines; wherein the bit lines are coupled to pairs of selection transistors that are coupled to two mutually adjacent word lines; and wherein the selection transistors of adjacent rows along a respective word line are not coupled to mutually adjacent bit lines. - View Dependent Claims (8, 9, 10, 11, 12, 13, 14, 15, 16, 19, 20)
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Specification