Testing apparatus and testing method
First Claim
1. A testing apparatus that concurrently tests a plurality of memories under test, comprising:
- a pattern generator that generates an address signal and a data signal to be supplied to each of the plurality of memories under test and an expectation signal to be output from each memory under test according to the address signal and the data signal;
a plurality of logic comparators, each of which being provided corresponding to one of the memories under test and comparing an output signal output from the corresponding memory under test according to the address signal and the data signal with the expectation signal to generate fail data when the output signal is not identical with the expectation signal;
a plurality of fail memories, each of which being provided corresponding to one of the memories under test and storing the fail data generated by the corresponding logic comparator in association with an address shown by the address signal;
a plurality of memory controllers, each of which being provided corresponding to one of the memories under test and generating bad address information showing a bad address in the corresponding memory under test based on the fail data stored on the corresponding fail memory;
a plurality of universal buffer memories, each of which being provided corresponding to one of the memories under test and storing the bad address information generated from the corresponding memory controller; and
a plurality of bad information writing sections, each of which being provided corresponding to one of the memories under test and writing first bad information into the bad address in the corresponding memory under test, the bad address being shown by the bad address information stored on the corresponding universal buffer memory, the writing first bad information being performed concurrently for the plurality of memories under test.
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Accused Products
Abstract
There is provided a testing apparatus including: a pattern generator that generates an address signal and a data signal to be supplied to a plurality of memories under test and an expectation signal; a plurality of logic comparators that generate fail data when an output signal output from the plurality of memories under test and the expectation signal are not identical with each other; a plurality of fail memories that store the fail data generated from the plurality of logic comparators; a plurality of memory controllers that generate bad address information showing a bad address in the memory under test based on the fail data stored on the plurality of fail memories; a plurality of universal buffer memories that store the bad address information generated from the plurality of memory controllers; and a plurality of bad information writing sections that concurrently write bad information into the bad address in the plurality of memories under test, which is shown by the bad address information stored on the plurality of universal buffer memories.
14 Citations
15 Claims
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1. A testing apparatus that concurrently tests a plurality of memories under test, comprising:
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a pattern generator that generates an address signal and a data signal to be supplied to each of the plurality of memories under test and an expectation signal to be output from each memory under test according to the address signal and the data signal; a plurality of logic comparators, each of which being provided corresponding to one of the memories under test and comparing an output signal output from the corresponding memory under test according to the address signal and the data signal with the expectation signal to generate fail data when the output signal is not identical with the expectation signal; a plurality of fail memories, each of which being provided corresponding to one of the memories under test and storing the fail data generated by the corresponding logic comparator in association with an address shown by the address signal; a plurality of memory controllers, each of which being provided corresponding to one of the memories under test and generating bad address information showing a bad address in the corresponding memory under test based on the fail data stored on the corresponding fail memory; a plurality of universal buffer memories, each of which being provided corresponding to one of the memories under test and storing the bad address information generated from the corresponding memory controller; and a plurality of bad information writing sections, each of which being provided corresponding to one of the memories under test and writing first bad information into the bad address in the corresponding memory under test, the bad address being shown by the bad address information stored on the corresponding universal buffer memory, the writing first bad information being performed concurrently for the plurality of memories under test. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A testing apparatus that concurrently tests a plurality of memories under test, comprising:
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a pattern generator that generates an address signal and a data signal to be supplied to each of the plurality of memories under test and an expectation signal to be output from each memory under test according to the address signal and the data signal; a plurality of logic comparators, each of which being provided corresponding to one of the memories under test and comparing an output signal output from the corresponding memory under test according to the address signal and the data signal and the expectation signal to generate fail data when the output signal is not identical with the expectation signal; a plurality of fail memories, each of which being provided corresponding to one of the memories under test and storing the fail data generated by the corresponding logical comparator in association with an address shown by the address signal; a plurality of memory controllers, each of which being provided corresponding to one of the memories under test and generating bad information with a format peculiar to each memory under test based on the fail data stored on the corresponding fail memory; a plurality of universal buffer memories, each of which being provided corresponding to one of the memories under test and storing the bad information generated from the corresponding memory controller; and a plurality of bad information writing sections, each of which being provided corresponding to one of the memories under test and writing the bad information stored on the corresponding universal buffer memory, the writing the bad information being performed concurrently for the plurality of memories under test.
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14. A testing method for concurrently testing a plurality of memories under test, comprising:
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generating an address signal and a data signal to be supplied to each of the plurality of memories under test and an expectation signal to be output from each memory under test according to the address signal and the data signal; comparing an output signal output from each memory under test according to the address signal and the data signal with the expectation signal to generate fail data when the output signal is not identical with the expectation signal by means of a plurality of logic comparators, each of which is provided corresponding to one of the memories under test; storing the fail data in association with an address shown by the address signal on a plurality of fail memories, each of which is provided corresponding to one of the memories under test; generating bad address information showing a bad address in each memory under test based on the fail data stored on the corresponding fail memory by means of a plurality of memory controllers, each of which is provided corresponding to one of the memories under test; storing the bad address information generated by each memory controller on a plurality of universal buffer memories, each of which is provided corresponding to one of the memories under test; and writing a first bad information into the bad address in each memory under test, the bad address being shown by the bad address information stored on the corresponding universal buffer memory by means of a plurality of bad information writing sections, each of which is provided corresponding to one of the memories under test, the writing the first bad information being performed concurrently for the plurality of memories under test.
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15. A testing method for concurrently testing a plurality of memories under test, comprising:
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generating an address signal and a data signal to be supplied to each of the plurality of memories under test and an expectation signal to be output from each memory under test according to the address signal and the data signal; comparing an output signal output from each memory under test according to the address signal and the data signal with the expectation signal to generate fail data when the output signal is not identical with the expectation signal by means of a plurality of logic comparators, each of which is provided corresponding to one of the memories under test; storing the fail data generated by each logic comparator in association with an address shown by the address signal by means of a plurality of fail memories, each of which is provided corresponding to one of the memories under test; generating bad information with a format peculiar to each memory under test based on the fail data stored on the corresponding fail memory by means of a plurality of memory controllers, each of which is provided corresponding to one of the memories under test; storing the bad information generated by each memory controller by means of a plurality of universal buffer memories, each of which is provided corresponding to one of the memories under test; and writing the bad information stored on each universal buffer memory into the corresponding memory under test by means of a plurality of bad information writing sections, each of which is provided corresponding to one of the memories under test, the writing the bad information being performed concurrently for the plurality of memories under test.
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Specification