Methods of imaging in probe microscopy
First Claim
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1. A system for generating definable nano-scale properties of a sample, comprising:
- an integrated force sensor positioned in proximity to and detecting said sample;
a first output signal corresponding to detected material properties of said sample;
a second output signal corresponding to detected surface properties of said sample;
a hardware component for receiving said force sensor output signals and selectively transmitting received signals; and
a software component for controlling operating parameters of said hardware component, receiving transmitted signals from said hardware component, determining material and surface properties of said sample according to received data, and outputting said determinations, wherein said integrated force sensor comprises;
a detection surface;
at least one reflective diffraction grating provided in connection with said detection surface;
a force sensor attached to said detection surface, said force sensor comprising;
a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to independently deflect upon exposure to an external force, thereby changing the first distance; and
a probe tip disposed on an outer surface of the flexible mechanical structure;
an actuator coupled to each of the diffraction grating and flexible mechanical structure and configured to electrostatically apply force to the flexible mechanical structure; and
a detector configured to measure deflection of said flexible mechanical structure.
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Abstract
In accordance with an embodiment of the invention, there is a force sensor for a probe based instrument. The force sensor can comprise a detection surface and a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to deflect upon exposure to an external force, thereby changing the first distance.
98 Citations
48 Claims
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1. A system for generating definable nano-scale properties of a sample, comprising:
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an integrated force sensor positioned in proximity to and detecting said sample; a first output signal corresponding to detected material properties of said sample; a second output signal corresponding to detected surface properties of said sample; a hardware component for receiving said force sensor output signals and selectively transmitting received signals; and a software component for controlling operating parameters of said hardware component, receiving transmitted signals from said hardware component, determining material and surface properties of said sample according to received data, and outputting said determinations, wherein said integrated force sensor comprises; a detection surface; at least one reflective diffraction grating provided in connection with said detection surface; a force sensor attached to said detection surface, said force sensor comprising; a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to independently deflect upon exposure to an external force, thereby changing the first distance; and a probe tip disposed on an outer surface of the flexible mechanical structure; an actuator coupled to each of the diffraction grating and flexible mechanical structure and configured to electrostatically apply force to the flexible mechanical structure; and a detector configured to measure deflection of said flexible mechanical structure. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27)
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28. A method of determining nano-scale properties of a sample, comprising:
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positioning an integrated force sensor in proximity to said sample; detecting said sample with at least said integrated force sensor; selectively outputting at least one signal corresponding to detected material properties of said sample and corresponding to detected surface properties of said sample; providing a hardware component for receiving said force sensor output signals and selectively transmitting received signals; and providing a software component for controlling operating parameters of said hardware component, receiving transmitted signals from said hardware component, determining material and surface properties of said sample according to received data, and outputting said determinations, wherein said integrated force sensor comprises; a detection surface; at least one reflective diffraction grating provided in connection with said detection surface; a force sensor attached to said detection surface, said force sensor comprising; a flexible mechanical structure disposed a first distance above the detection surface so as to form a gap between the flexible mechanical structure and the detection surface, wherein the flexible mechanical structure is configured to independently deflect upon exposure to an external force, thereby changing the first distance; and a probe tip disposed on an outer surface of the flexible mechanical structure; an actuator coupled to each of the diffraction grating and flexible mechanical structure and configured to electrostatically apply force to the flexible mechanical structure; and a detector configured to measure deflection of said flexible mechanical structure. - View Dependent Claims (29, 30, 31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48)
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Specification