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Fixed pattern noise removal in CMOS imagers across various operational conditions

  • US 7,443,431 B2
  • Filed: 04/25/2003
  • Issued: 10/28/2008
  • Est. Priority Date: 09/13/2002
  • Status: Active Grant
First Claim
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1. A method of minimizing noise in an image produced by an electronic imager comprising:

  • generating a correction system having a range of imager integration times and a range of imager temperatures for an electronic imager which has taken a series of dark capture images and a series of flat field capture images in a calibration mode; and

    applying said correction system to a plurality of images having different integration times or imager temperatures produced by said electronic imager in an image capture mode without reentering the calibration mode by using the correction system to perform regression analysis for the different integration times or imager temperatures.

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