Trench photosensor for a CMOS imager
First Claim
Patent Images
1. A method of converting an optical signal to an electrical signal, comprising:
- receiving said optical signal at a surface of a photoreceptor;
absorbing said optical signal through said surface of said photoreceptor;
generating electrons with said photoreceptor in relation to an intensity of said optical signal;
storing said electrons in sidewalls and a bottom of a substantially concave cavity within a substrate, said sidewalls and bottom of said cavity forming a part of said photoreceptor; and
adjusting an electrical output signal in relation to a magnitude of said stored electrons.
2 Assignments
0 Petitions
Accused Products
Abstract
A trench photosensor for use in a CMOS imager having an improved charge capacity. The trench photosensor may be either a photogate or photodiode structure. The trench shape of the photosensor provides the photosensitive element with an increased surface area compared to a flat photosensor occupying a comparable area on a substrate. The trench photosensor also exhibits a higher charge capacity, improved dynamic range, and a better signal-to-noise ratio. Also disclosed are processes for forming the trench photosensor.
30 Citations
12 Claims
-
1. A method of converting an optical signal to an electrical signal, comprising:
-
receiving said optical signal at a surface of a photoreceptor; absorbing said optical signal through said surface of said photoreceptor; generating electrons with said photoreceptor in relation to an intensity of said optical signal; storing said electrons in sidewalls and a bottom of a substantially concave cavity within a substrate, said sidewalls and bottom of said cavity forming a part of said photoreceptor; and adjusting an electrical output signal in relation to a magnitude of said stored electrons. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
-
Specification