Probe for combined signals
First Claim
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1. A probe for simultaneously communicating a first signal and a second signal to a device, said probe comprising:
- (a) a first conductor connectable to a source of said first signal and having a suspended end portion;
(b) a first contact tip nonconductively affixed to said suspended end portion of said first conductor, said first contact tip engageable with a first contact pad of said device;
(c) a resistor conductively connecting said first contact tip to said first conductor; and
(d) a second conductor connectable to a source of said second signal and arranged to provide a conductive path from said source of said second signal to said first contact pad while said first contact tip is in engagement with said first contact pad.
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Abstract
A direct current and a modulation signal are simultaneously applied to contact pads on a device under test, such as a laser diode, with a probe that reduces signal distortion and power dissipation by transmitting a modulated signal through an impedance matching resistor and transmitting of a direct current over a second signal path that avoids the impedance matching resistor.
1071 Citations
10 Claims
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1. A probe for simultaneously communicating a first signal and a second signal to a device, said probe comprising:
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(a) a first conductor connectable to a source of said first signal and having a suspended end portion; (b) a first contact tip nonconductively affixed to said suspended end portion of said first conductor, said first contact tip engageable with a first contact pad of said device; (c) a resistor conductively connecting said first contact tip to said first conductor; and (d) a second conductor connectable to a source of said second signal and arranged to provide a conductive path from said source of said second signal to said first contact pad while said first contact tip is in engagement with said first contact pad. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification