Automatic test system with synchronized instruments

• US 7,454,681 B2
• Filed: 02/22/2005
• Issued: 11/18/2008
• Est. Priority Date: 11/22/2004
• Status: Active Grant

• Current Assignee: Teradyne Incorporated
• Original Assignee: Teradyne Incorporated
• Inventors: Reichert, Peter A., Nguyen, Thien D.
• Primary Examiner(s): Louis-Jacques, Jacques
• Assistant Examiner(s): NGUYEN, STEVE N
• Application Number:
  US11/063,289
• Publication Number:
  US 20060123297A1
• Time in Patent Office: 1,365 Days
• Field of Search: None
• US Class Current: 714/744
• CPC Class Codes: G01R 31/319 Tester hardware, i.e. output processing circuits
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Abstract

A test system with multiple instruments. Some instruments act as controller instruments and others act as controlled instruments. Each instrument includes a clock generator that synthesizes one or more local clocks from a reference clock. The reference clock is a relatively low frequency clock that can be inexpensively but accurately generated and distributed to all of the instruments. A communication link between instruments is provided. Timing circuits within instruments that are to exchange time information are synchronized to establish a common time reference. Thereafter, instruments communicate time dependent commands or status messages asynchronously over the communication link by appending to each message a time stamp reflecting a time expressed relative to the common time reference. The test system includes digital instruments that contain pattern generators that send command messages to analog instruments, which need not include pattern generators. The architecture simplifies design of analog instruments and avoids redesign of analog instrument as pattern rates of digital instruments change.

Claims

1. A test system, comprising:

a) a reference clock generator providing a reference clock;

b) a first instrument comprising

i) a first local clock generator coupled to the reference clock generator and providing a first local clock generated from the reference clock,

ii) a first control circuit storing programmed commands comprising at least one command to be executed by the first instrument and at least one command to be executed by a second instrument, and

c) a second instrument comprising

i) a second local clock generator coupled to the reference clock generator and providing a second local clock generated from the reference clock;

ii) a second control circuit having an input and an output, the second control circuit asserting the output at a time specified by a time value provided at the input to the second control circuit;

iii) functional circuitry having a control input coupled to the output of the second control circuit, the functional circuitry executing a function in response to a value asserted at its control input; and

d) a network between at least the first instrument and the second instrument, the network carrying a message that includes a time value, wherein the first control circuit is coupled to the network to provide the time value in the message and the second control circuit is coupled to the network to receive the time value at its input.

2. The test system of claim 1 wherein:

a) the message carried by the network further includes an event code,

b) the first control circuit is coupled to the network to generate an event code associated with the time value,

c) the second control circuit is coupled to the network to receive the event code associated with the time value, and

d) the second control circuit has an event output coupled to the function circuitry, the event output having a value indicating the event code at a time dictated by the time value associated with the event code.

3. The test system of claim 1 wherein the reference clock has a lower frequency than the first local clock and the second local clock.

4. The test system of claim 1 additionally comprising a master control circuit generating a synchronization signal provided to the first instrument, and wherein the first local clock generator comprises circuitry to align the first local clock in response to the synchronization signal.

5. The test system of claim 1 wherein the reference clock has a frequency of less than 500 MHz and a local clock generator in at least one of the first and second local clocks has a frequency in excess of 800 MHz.

6. The test system of claim 1 wherein the network comprises a switching circuit and a plurality of lines, each coupled between the switching circuit and an instrument.

7. The test system of claim 6 wherein the switching circuit comprises a router.

8. The test system of claim 6 wherein the message carried on the network includes an address and the switching circuit additionally comprises an address table that associates each of a plurality of addresses with one or more of the plurality of lines and circuitry that provides the message on a line selectively in response to the value of an address in the message and an entry in the address table.

9. The test system of claim 8 wherein at least one of the plurality of addresses is associated with a plurality of lines.

10. The test system of claim 8 wherein at least one address is associated with all of the lines.

11. The test system of claim 1 wherein the first control circuit comprises a pattern generator.

12. The test system of claim 1 wherein

a) the first control circuit comprises a first time-tracking circuit, clocked by the first local clock;

and

b) the second control circuit comprises a second time-tracking circuit clocked by the second local clock.

13. The test system of claim 1 wherein the first instrument comprises a digital instrument and the second instrument comprises an analog instrument.

14. A test system, comprising:

a) a reference clock generator providing a reference clock having a plurality of periods;

b) a first instrument comprising

i) a first local clock generator coupled to the reference clock generator and providing a first local clock generated from the reference clock,

ii) a first control circuit storing programmed commands comprising at least one command to be executed by the first instrument and at least one command to be executed by a second instrument, and

c) a network between at least the first instrument and the second instrument, the network carrying a message during a first period of the plurality of periods of the reference clock, the message including a time value,

d) the second instrument comprising

i) a second local clock generator coupled to the reference clock generator and providing a second local clock generated from the reference clock;

ii) a second control circuit having an input and an output, the second control circuit asserting the output at a time specified by the time value, wherein the time value specifies a time during a second period of the reference clock;

iii) functional circuitry having a control input coupled to the output of the second control circuit, the functional circuitry executing a function in response to a value asserted at its control input;

wherein the first control circuit is coupled to the network to provide the time value in the message and the second control circuit is coupled to the network to receive the time value at its input.

15. The test system of claim 14, wherein the first instrument is a digital instrument.

16. The test system of claim 15, wherein the second instrument is an analog instrument.