Semiconductor indicator for voltage diagnostics in power amplifiers

• US 7,459,979 B2
• Filed: 10/31/2005
• Issued: 12/02/2008
• Est. Priority Date: 03/03/2005
• Status: Expired due to Fees

• Current Assignee: STMicroelectronics Incorporated (STMicroelectronics NV)
• Original Assignee: STMicroelectronics Incorporated (STMicroelectronics NV)
• Inventors: Rotay, Craig J., Pritiskutch, John Christopher, Hildenbrandt, Richard R.
• Primary Examiner(s): Pascal; Robert J.
• Assistant Examiner(s): Wong; Alan
• Application Number:
  US11/263,116
• Publication Number:
  US 20060197602A1
• Time in Patent Office: 1,128 Days
• Field of Search: None
• US Class Current: 330/298
• CPC Class Codes: G01R 31/2623 for measuring break-down voltage therefor
• CPC Class Codes: G01R 31/311 of integrated circuits G01R31/31728 takes precedence
• CPC Class Codes: H03F 1/52 Circuit arrangements for protecting such amplifiers monitoring arrangements G01R31/28; increasing reliability in communication systems, e.g. using redundancy H04B1/74
• CPC Class Codes: H03F 2200/447 the amplifier being protected to temperature influence
• CPC Class Codes: H03F 3/21 with semiconductor devices only H03F3/245 takes precedence

Abstract

A semiconductor indicator for quantitatively diagnosing voltage conditions in high power transistor devices is provided. The semiconductor indicator includes a first transistor and a second transistor, where an electrically active periphery of the second transistor is less than an electrically active periphery of the first transistor. The transistors are thermally coupled to one another and may be in close proximity. The second transistor detects the voltage of a node on the first transistor and may be monitored by infrared imaging. The breakdown voltage characteristic of the second transistor may not substantially change as the temperature in the first transistor increases. An optional control circuit monitors and detects the output voltage of the first transistor.

Claims

1. An indicator for voltage diagnostics in a power amplifier comprising:

a first transistor having an electrically active periphery; and

a second transistor having an electrically active periphery less than the electrically active periphery of the first transistor and thermally coupled to the first transistor;

wherein a voltage of a node on the first transistor is detected using the second transistor; and

wherein a ratio between the electrically active periphery of the first transistor and the electrically active periphery of the second transistor is large enough to at least one of;

reduce a parasitic capacitance between the first transistor and the second transistor, and

increase a sensitivity of the second transistor.

2. The indicator of claim 1, further comprising a control circuit.

3. The indicator of claim 2, further comprising an infrared sensor wherein an output of the infrared sensor is an input of the control circuit.

4. The indicator of claim 2, wherein the control circuit is situated on at least one of:

a substrate common to the first transistor;

a substrate common to the second transistor; and

a substrate unique to either the first transistor or the second transistor.

5. The indicator of claim 2, wherein the voltage of the node on the first transistor is detected using the second transistor by at least one of:

measuring an actual temperature at an output node of the first transistor;

measuring emitted infrared energy with a detector; and

using a current sensing circuit.

6. The indicator of claim 1, wherein a thermal gradient exists between the first transistor and the second transistor 1 the thermal gradient being proportional to a distance between the first transistor and the second transistor.

7. The indicator of claim 1, wherein a breakdown voltage characteristic of the second transistor does not substantially change as a temperature of the first transistor increases.

8. The indicator of claim 1, wherein the first transistor and the second transistor are situated on different substrates.

9. The indicator of claim 1, wherein the first transistor and the second transistor are situated on a common substrate.

10. The indicator of claim 1, wherein the voltage of the node on the first transistor is detected using the second transistor by at least one of:

measuring an actual temperature at an output node of the first transistor;

measuring emitted infrared energy with a detector; and

using a current sensing circuit.

11. The indicator of claim 1, wherein the indicator is used in at least one of:

a plasma generation application;

magnetic resonance imaging system;

a communication system;

a switch-mode power supply;

an audio amplifier; and

a laser application.

12. A method for voltage diagnostics in a power amplifier, the method comprising:

detecting a voltage of a node on a first transistor using a second transistor, the second transistor having an electrically active periphery less than an electrically active periphery of the first transistor and thermally coupled to the first transistor; and

wherein a ratio between the electrically active periphery of the first transistor and the electrically active periphery of the second transistor is large enough to at least one of;

reduce a parasitic capacitance between the first transistor and the second transistor, and

increase a sensitivity of the second transistor.

13. The method of claim 12, further comprising using a control circuit to control operation of the power amplifier.

14. The method of claim 13, further comprising using an infrared sensor to capture an infrared image of the first and second transistors, wherein an output of the infrared sensor is an input of the control circuit.

15. The method of claim 13, wherein the control circuit is situated on at least one of:

a substrate common to the first transistor;

a substrate common to the second transistor; and

a substrate unique to either the first transistor or the second transistor.

16. The method of claim 13, wherein the voltage is detected using a current sensing circuit.

17. The method of claim 12, wherein the voltage is detected by measuring an actual temperature at an output node of the first transistor using the second transistor.

18. The method of claim 12, wherein the voltage is detected by measuring emitted infrared energy of either the first transistor or the second transistor with a detector.

19. The method of claim 12, wherein the voltage is detected using a current sensing circuit.

20. The method of claim 12, wherein a breakdown voltage characteristic of the second transistor does not substantially change as a temperature of the first transistor increases.