Contact probe storage fet sensor and write heater arrangements

• US 7,460,462 B2
• Filed: 12/17/2003
• Issued: 12/02/2008
• Est. Priority Date: 12/17/2003
• Status: Expired due to Fees

• Current Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Original Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Inventors: Mejia, Robert G., Hilton, Richard Lee
• Primary Examiner(s): Feild; Joseph
• Assistant Examiner(s): HALEY, JOSEPH R
• Application Number:
  US10/736,600
• Publication Number:
  US 20050135199A1
• Time in Patent Office: 1,812 Days
• Field of Search: None
• US Class Current: 369/126
• CPC Class Codes: B82Y 10/00 Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
• CPC Class Codes: G11B 11/08 using recording by electric charge or by variation of electric resistance or capacitance G11B11/002, G11B11/10 take precedence
• CPC Class Codes: G11B 11/16 using recording by mechanical cutting, deforming or pressing G11B11/002 takes precedence
• CPC Class Codes: G11B 9/14 using microscopic probe means , i.e. recording or reproducing by means directly associated with the tip of a microscopic electrical probe as used in Scanning Tunneling Microscopy [STM] or Atomic Force Microscopy [AFM] for inducing physical or electrical perturbations in a recording medium; Record carriers or media specially adapted for such transducing of information marking using electrical current B41M5/20; measuring roughness or irregularity of surfaces G01B7/34; details of scanning-probe microscopes G01Q
• CPC Class Codes: G11B 9/1409 Heads

Abstract

A read/write arrangement for a contact probe storage arrangement or the like, has a cantilever disposed with a medium which is movable relative to the cantilever; a device associated with one of the cantilever and the medium which is configured to be responsive to changes in electrical field between the medium and the cantilever caused by a change in distance between the medium and the cantilever; a heater disposed on the cantilever for heating the medium and for inducing localized topographical changes which represent bits of data; and a circuit which electrically interconnects both of the device and the heater.

Claims

1. A read/write arrangement comprising:

a cantilever disposed with a medium that is supported on an electrically conductive substrate and that is movable relative to the cantilever;

a device included in the cantilever and being responsive to changes in an electrical field that is generated between the electrically conductive substrate of the medium and the cantilever caused by a change in distance between the medium and the cantilever;

a heater disposed on the cantilever for heating the medium and for inducing localized topographical changes which represent bits of data; and

a circuit that electrically interconnects both of the device and the heater and that responds to changes in current through the device caused by changes in the electrical field.

2. A read/write arrangement as set forth in claim 1, wherein the circuit forms at least a part of the device.

3. A read/write arrangement as set forth in claim 1, wherein the circuit has portions which are common to both the device and the heater.

4. A read/write arrangement as set forth in claim 1, wherein the cantilever comprises a probe which extends from the cantilever and which is configured to be contactable with a surface of the medium and to respond to a topography of the medium to cause the distance between the cantilever and the medium to vary.

5. A read/write arrangement as set forth in claim 1, wherein the medium is electrically non-conductive and is formed over the electrically conductive substrate.

6. A read/write arrangement as set forth in claim 1, wherein the device is a FET (Field Effect Transistor).

7. A read/write arrangement as set forth in claim 6, wherein the circuit comprises a plurality of electrically conductive traces which are formed in the cantilever and which comprise a source and a drain of the FET and wherein the source or drain of the FET forms part of a circuit which supplies electrical current to the heater.

8. A read/write arrangement as set forth in claim 7, wherein the plurality of electrically conductive traces further comprise a channel interposed between the source and the drain of the FET.

9. A read/write arrangement as set forth in claim 7, wherein the cantilever is made of silicon and the electrically conductive traces are formed by doping the silicon to render selected regions electrically conductive.

10. A read/write arrangement as set forth in claim 7, wherein the heater comprises a doped region having an electrical resistance which is higher than the traces.

11. A read/write arrangement as set forth in claim 9, wherein the cantilever has a pair of arms which are interconnected by a bridge member, wherein the probe is formed on the bridge member, wherein the heater is formed on the bridge member and wherein the doped traces are formed on both arms.

12. A read/write arrangement as set forth in claim 6, wherein the FET is configured to function as the heater.