Time shifting signal acquisition probe system

• US 7,463,015 B2
• Filed: 12/29/2006
• Issued: 12/09/2008
• Est. Priority Date: 12/29/2006
• Status: Active Grant

• Current Assignee: Tektronix Incorporated (Fortive Corp.)
• Original Assignee: Tektronix Incorporated (Fortive Corp.)
• Inventors: Rettig, John B., Mende, Michael J.
• Primary Examiner(s): Gutierrez; Diego
• Assistant Examiner(s): NGUYEN, HOAI AN D
• Application Number:
  US11/648,385
• Publication Number:
  US 20080159368A1
• Time in Patent Office: 711 Days
• Field of Search: 324/76.11, 324/437, 324/445, 324/446, 324/751, 324/752, 324/754, 324/757, 324/758, 324/690, 324/696, 324/715, 324/724, 324/72.5, 702/85, 702/108, 702/121, 702/122, 702/127, 702/189, 702/190
• US Class Current: 324/76.11
• CPC Class Codes: G01R 1/06772 High frequency probes
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18
• CPC Class Codes: G01R 13/0254 for triggering, synchronisation
• CPC Class Codes: G01R 13/0272 for sampling

Abstract

A time shifting signal acquisition probe system has a signal acquisition probe having a memory containing a time delay constant representative of the propagation time delay of an electrical signal passing through the signal acquisition probe. A measurement test instrument receives the electrical signal from the signal acquisition probe and generating digital samples of the electrical signal in an acquisition system in response to a trigger signal and producing a waveform record. A communications bus coupled between the signal acquisition probe and the measurement test instrument couples the signal acquisition probe time delay constant from the signal acquisition probe to the measurement test instrument wherein processing circuitry in the measurement test instrument time shifts the waveform record of the electrical signal relative to the trigger signal by the amount of the signal acquisition probe time delay constant.

Claims

1. A time shifting signal acquisition probe system comprising

a signal acquisition probe having a memory therein containing a time delay value representative of the propagation time delay of an electrical signal passing through the signal acquisition probe;

a measurement test instrument receiving the electrical signal from the signal acquisition probe generating digital samples of the electrical signal in an acquisition system and producing a waveform record in response to a trigger signal; and

a communications bus coupled between the signal acquisition probe and the measurement test instrument for coupling the signal acquisition probe time delay value from the signal acquisition probe to the measurement test instrument wherein processing circuitry in the measurement test instrument time shifts the waveform record of the electrical signal relative to the trigger signal by the amount of the signal acquisition probe time delay value.

2. The time shifting signal acquisition probe system as recited in claim 1 wherein the waveform record has a starting pointer index that is time shifted relative to the trigger signal by the amount of the signal acquisition probe time delay value.

3. The time shifting signal acquisition probe system as recited in claim 2 processing circuitry further comprises display circuitry receiving the waveform record and displaying a portion of the waveform record on a display device.

4. The time shifting signal acquisition probe system as recited in claim 3 wherein the portion of the waveform record being displayed has a starting display pointer index into the waveform record and an ending display pointer into the waveform record.

5. The time shifting signal acquisition probe system as recited in claim 4 wherein the displayed portion of the waveform record includes the digital samples of the waveform record from the starting display pointer index to the ending display pointer index.

6. The time shifting signal acquisition probe system as recited in claim 1 further comprising a second signal acquisition probe having a memory therein containing a second signal acquisition probe time delay value representative of the propagation time delay of a second electrical signal through the second signal acquisition probe with the second signal acquisition probe coupling the second electrical signal to the measurement test instrument that generates digital samples of the second electrical signal in a second acquisition system and produces a second waveform record in response to the trigger signal, and a second communications bus coupled between the second signal acquisition probe and the measurement test instrument for coupling the second signal acquisition probe time delay value to the measurement test instrument wherein the processing circuitry time shifts the second waveform record of the second electrical signal relative to the trigger signal by the amount of the second signal acquisition probe time delay value.

7. The time shifting signal acquisition probe system as recited in claim 6 wherein the waveform records of the electrical signal and the second electrical signal are substantially time aligned relative to the trigger signal.

8. The time shifting signal acquisition probe system as recited in claim 7 wherein the waveform records of the electrical signal and the second electrical signal each have a starting pointer index that is time shifted relative to the trigger signal by the amount of the signal acquisition probe time delay values of the respective signal acquisition probe and the second signal acquisition probe.

9. The time shifting signal acquisition probe system as recited in claim 8 processing circuitry further comprises display circuitry receiving the waveform records of the electrical signal and the second electrical signal and displaying a portion of each of the waveform records on a display device.

10. The time shifting signal acquisition probe system as recited in claim 9 wherein the portions of the waveform records being displayed each has a starting display pointer index into the its respective waveform record and an ending display pointer into its waveform record.

11. The time shifting signal acquisition probe system as recited in claim 10 wherein the displayed portions of each of the waveform records includes the digital samples of the waveform record from the starting display pointer index to the ending display pointer index.

12. A time shifting signal acquisition probe system comprising

a signal acquisition probe having a memory therein containing a time delay value representative of the propagation time delay of an electrical signal passing through the signal acquisition probe;

a measurement test instrument receiving the electrical signal from the signal acquisition probe generating digital samples of the electrical signal in an acquisition system and producing a waveform record in response to a trigger signal; and

a communications bus coupling the signal acquisition probe time delay value to the measurement test instrument wherein processing circuitry in the measurement test instrument time shifts a portion of the waveform record relative to the trigger signal by the amount of the signal acquisition probe time delay value.

13. The time shifting signal acquisition probe system as recited in claim 12 processing circuitry further comprises display circuitry receiving and displaying the time shifted portion of the waveform record on a display device.

14. The time shifting signal acquisition probe system as recited in claim 13 wherein the portion of the waveform record being displayed has starting and ending display pointer indexes into the waveform record that are time shifted relative to the trigger signal by the amount of the signal acquisition probe time delay value.

15. The time shifting signal acquisition probe system as recited in claim 12 further comprising a second signal acquisition probe having a memory therein containing a second signal acquisition probe time delay value representative of the propagation time delay of a second electrical signal through the second signal acquisition probe with the second signal acquisition probe coupling the second electrical signal to the measurement test instrument that generates digital samples of the second electrical signal in a second acquisition system and produces a second waveform record in response to the trigger signal, and a second communications bus coupled between the second signal acquisition probe and the measurement test instrument for coupling the second signal acquisition probe time delay value to the measurement test instrument wherein the processing circuitry time shifts a portion of the second waveform record of the second electrical signal relative to the trigger signal by the amount of the second signal acquisition probe time value.

16. The time shifting signal acquisition probe system as recited in claim 15 wherein the portions of the waveform records of the electrical signal and the second electrical signal are substantially time aligned relative to the trigger signal.

17. The time shifting signal acquisition probe system as recited in claim 16 wherein the portions of the waveform records of the electrical signal and the second electrical signal each have starting and ending pointer indexes that are time shifted relative to the trigger signal by the amount of the signal acquisition probe time delay values of the respective signal acquisition probe and the second signal acquisition probe.

18. The time shifting signal acquisition probe system as recited in claim 17 processing circuitry further comprises display circuitry receiving the portions of the waveform records of the electrical signal and the second electrical signal and displaying the portions of each of the waveform records on a display device.

19. The time shifting signal acquisition probe system as recited in claim 18 wherein the displayed portions of each of the waveform records includes the digital samples of the waveform record from the starting display pointer index to the ending display pointer index.

20. A time shifting signal acquisition module system comprising

a signal acquisition module having a memory therein containing time delay values representative of the propagation time delays of electrical signals in the signal acquisition module with one of the electrical signal being received from a device under test and repetitively sampled in response to a strobe signal to generate electrical samples of the electrical signal;

a measurement test instrument receiving the electrical samples of the electrical signal and generating digital samples of the electrical samples to produce a waveform record; and

a communications bus coupled between the signal acquisition module and the measurement test instrument for coupling the signal acquisition module time delay values from the signal acquisition module to the measurement test instrument wherein processing circuitry in the measurement test instrument time shifts the electrical samples of the waveform record by an amount of the signal acquisition module time delay values.

21. The time shifting signal acquisition module system as recited in claim 20 wherein the signal acquisition module receives the electrical signal from the device under test and the strobe signal from the measurement test instrument with the memory containing time delay values representing the propagation delay in the signal path of the signal under test and a propagation delay in the signal path of the strobe signal.

22. The time shifting signal acquisition module system as recited in claim 20 wherein the measurement test instrument subtracts the time delay value representing the propagation delay in the signal path of the strobe signal from the time delay value representing the propagation delay in the signal path of the signal under test and applies the result to the electrical samples of the waveform record.