Carrier module for adapting non-standard instrument cards to test systems

• US 7,463,018 B2
• Filed: 03/14/2008
• Issued: 12/09/2008
• Est. Priority Date: 05/21/2004
• Status: Active Grant

• Current Assignee: Advantest Corporation
• Original Assignee: Advantest Corporation
• Inventors: Kushnick, Eric Barr, Kraus, Lawrence, Getchell, James, Furukawa, Yasuo
• Primary Examiner(s): Nguyen; Ha Tran
• Assistant Examiner(s): Nguyen; Trung Q
• Application Number:
  US12/048,990
• Publication Number:
  US 20080157805A1
• Time in Patent Office: 270 Days
• Field of Search: 324/158.1, 324/556, 324750-765, 714/702, 714/719
• US Class Current: 324/756.02
• CPC Class Codes: G01R 31/31907 Modular tester, e.g. controlling and coordinating instruments in a bus based architecture

Abstract

A carrier module that is able to adapt non-standard instrument cards to the architecture of a test system is disclosed. Instrument cards based on non-standard architectures may be combined on a single carrier module. The carrier module is then plugged into the test head of the test system. The carrier module provides circuitry, contained on a plug-in sub-module called an Application Interface Adapter (AIA), to interface between the instrument cards and the test head interface connector. Additionally, the AIA may also provide access from the instrument cards to ATE system calibration circuitry. The carrier module uses the standard data bus of the test system for housekeeping and control functions. A second bus provides the bus for the non-standard instrument cards. Software drivers provided with the instrument cards are encapsulated with an appropriate wrapper so that the cards run seamlessly in the software environment of the test system.

Claims

1. A method for adapting one or more instrument cards to a test system for testing integrated circuits, the one or more instrument cards being non-standard with respect to the test system, the method comprising:

providing clock and control signals to the one or more instrument cards;

connecting the one or more instrument cards to a device under test (DUT);

bridging a non-standard system bus of the one or more instrument cards to a bus of a test system controller; and

controlling the one or more instrument cards via a standard test system bus and the bus of the test system controller.

2. The method as recited in claim 1, further comprising selectively routing signals from the one or more instrument cards to test system calibration circuitry.

3. The method as recited in claim 1, further comprising:

selectively routing digital pins on digital modules within the test system to the DUT; and

sending test signals from the digital pins on the digital modules to the DUT to perform testing.

4. The method as recited in claim 1, further comprising monitoring voltages, currents and temperatures and communicating the monitored voltages, currents and temperatures over the standard test system bus.

5. The method as recited in claim 1, further comprising performing real-time monitoring of selected voltages, currents and temperatures, comparing these measurements to predefined limits, and sending alarms or messages over the standard test system bus if a measurement exceeds the predefined limits.

6. The method as recited in claim 5, further comprising translating test system software commands into low-level driver software commands for controlling the one or more instrument cards via the bus of the test system controller.

7. The method as recited in claim 1, further comprising controlling the non-standard system bus using a local controller located on the carrier module.

8. The method as recited in claim 1, further comprising supporting the one or more instrument cards on a PCB.

9. The method as recited in claim 8, further comprising supporting two or more stacks of two or more instrument cards on the PCB.

10. The method as recited in claim 8, further comprising supporting two side-by-side instrument cards on the PCB.

11. The method as recited in claim 10, further comprising coupling the carrier module to one module slot in the test system.

12. The method as recited in claim 8, further comprising slidably supporting the instrument cards on the PCB.

13. The method as recited in claim 1, further comprising minimizing a thickness of the adapted one or more instrument cards by supporting the one or more instrument cards within a cutout area formed in a PCB so that at least one of the instrument cards lies partially about and partially below the level of the PCB.

14. The method as recited in claim 13, further comprising maintaining a thickness of two or more standard test system modules by supporting two or more stacks of two or more instrument cards within the cutout area in the PCB.

15. The method as recited in claim 13, further comprising maintaining a thickness of not more than one standard test system module by supporting two side-by-side instrument cards within the cutout area in the PCB.

16. The method as recited in claim 15, further comprising coupling the carrier module to one module slot in the test system.

17. The method as recited in claim 13, further comprising slidably supporting the instrument cards within the cutout area formed in the PCB.