Systems and methods for testing wireless devices

• US 7,463,140 B2
• Filed: 04/07/2006
• Issued: 12/09/2008
• Est. Priority Date: 06/22/2001
• Status: Expired due to Term

• Current Assignee: Intellectual Ventures I LLC (Intellectual Ventures LLC)
• Original Assignee: Gallitzin Allegheny LLC (Intellectual Ventures LLC)
• Inventors: Schmidt, Dominik J.
• Primary Examiner(s): Previl; Daniel
• Application Number:
  US11/400,627
• Publication Number:
  US 20060186893A1
• Time in Patent Office: 977 Days
• Field of Search: 340/514, 340/635, 340/634, 340/870.01, 324/765, 324/500, 324/754, 324/764, 324/601, 324/605, 714733-734, 714/30, 714/25, 714/46, 714/736, 714/41
• US Class Current: 340/514
• CPC Class Codes: H04W 24/00 Supervisory, monitoring or testing arrangements
• CPC Class Codes: H04W 88/02 Terminal devices

Abstract

Systems and methods are disclosed for parallel testing one or more wireless devices using a single wireless command, each device including a processor and memory coupled to the processor. The system includes a tester adapted to exercise the wireless devices, including: a transceiver adapted to communicate with each wireless device; and a computer coupled to the transceiver, the computer adapted to test all wireless devices in parallel by issuing a single test command using a wireless signal, the computer adapted to store test patterns and test results.

Claims

1. A method comprising:

during a test mode, wirelessly receiving a test command via radio frequency circuitry within each of a plurality of wireless devices formed on a wafer, wherein the radio frequency circuitry in each of the plurality of wireless devices is also operable during normal operation of the wireless device; and

during the test mode, testing the plurality of wireless devices responsive to the test command.

2. The method of claim 1, wherein the test command is wirelessly received via one or more pads on each of the plurality of wireless devices.

3. The method of claim 1, wherein the test command is wirelessly received via a power wire on each of the plurality of wireless devices.

4. The method of claim 1, wherein said testing is performed in parallel.

5. The method of claim 1, wherein said testing includes testing a non-volatile memory of each of the plurality of wireless devices.

6. The method of claim 5, wherein said testing includes, after said testing of the non-volatile memory of a first of the plurality of wireless devices, wirelessly loading a test program for the radio frequency circuitry and digital circuitry of the first wireless device in the non-volatile memory.

7. The method of claim 6, further comprising clearing the test program and wirelessly loading operating software to those ones of the plurality of wireless devices that pass the testing.

8. The method of claim 5, wherein said testing includes receiving a supply voltage at the wafer at different levels and determining a maximum supply voltage for programmed data of the non-volatile memory of each of the plurality of wireless devices.

9. An integrated circuit (IC) comprising:

a wireless device having an analog portion including at least one radio frequency core, and a digital portion including a processor coupled to the at least one radio frequency core, wherein the processor is configured to communicate according to a plurality of wireless communication protocols;

wherein the at least one radio frequency core of the wireless device is configured to operate;

in a test mode while the IC is part of a wafer that includes a plurality of wireless devices; and

in a normal operational mode when the IC is separated from the wafer and in an IC package.

10. The IC of claim 9, wherein the at least one radio frequency core comprises a short-range wireless transceiver core and a cellular radio core.

11. The IC of claim 10, wherein the short-range wireless transceiver core and the cellular radio core are formed on a single substrate.

12. The IC of claim 9, wherein the wireless device includes a non-volatile memory coupled to the processor.

13. The IC of claim 12, wherein the non-volatile memory includes calibration data obtained during testing.

14. The IC of claim 9, wherein the wireless device further comprises:

a switch;

a power pad coupled to the switch; and

a bit pad coupled to the switch, wherein the bit pad is controlled during the wireless test process to enable the wireless device to receive operating power via the power pad.

15. A computer-readable medium including instructions that when executed cause a system to:

wirelessly transmit a test command to radio frequency circuitry within each of a plurality of wireless devices formed on a wafer, wherein the radio frequency circuitry is configured to operate in a test mode and during normal operation; and

wirelessly receive test results from at least some of the plurality of wireless devices that are tested in response to the test command.

16. The computer-readable medium of claim 15, further comprising instructions that when executed cause the system to communicate with individual ones of the plurality of wireless devices regarding the test results.

17. The computer-readable medium of claim 15, further comprising instructions that when executed cause the system to wirelessly transmit a test program to each of the plurality of wireless devices.

18. The computer-readable medium of claim 15, further comprising instructions that when executed cause the system to wirelessly transmit operating software to at least some of the plurality of wireless devices.

19. A mobile device comprising:

an integrated circuit comprising;

means for wirelessly receiving a test command during a wafer-level test mode of the integrated circuit;

an analog portion including at least one radio frequency core configured to operate during said test mode of the integrated circuit and during normal operation of said mobile device;

a digital portion including a processor coupled to the at least one radio frequency core, wherein the processor is configured to communicate according to a plurality of wireless communication protocols.