Ionic liquid high temperature gas sensors

• US 7,464,580 B2
• Filed: 09/18/2006
• Issued: 12/16/2008
• Est. Priority Date: 09/26/2005
• Status: Active Grant

• Current Assignee: Oakland University
• Original Assignee: Oakland University
• Inventors: Yu, Lei, Zeng, Xiangqun, Ren, Rex Xiaofeng
• Primary Examiner(s): Cygan; Michael
• Application Number:
  US11/522,833
• Publication Number:
  US 20070068222A1
• Time in Patent Office: 820 Days
• Field of Search: 73/240.1, 73/240.6
• US Class Current: 73/24.01
• CPC Class Codes: G01N 2291/0215 Mixtures of three or more gases, e.g. air
• CPC Class Codes: G01N 2291/0253 Condensation
• CPC Class Codes: G01N 2291/0254 Evaporation
• CPC Class Codes: G01N 29/036 by measuring frequency or resonance of acoustic waves
• CPC Class Codes: G01N 29/228 related to high temperature conditions

Abstract

An ionic liquid piezoelectric gas sensor for the detection of polar and nonpolar organic vapors. The gas sensor can operate at high temperatures with a fast linear response which is also reversible. At high temperatures, the frequency change (Δf) versus concentration (C) curve mirrors the Henry'"'"'s gas law, such that the concentration of a gas sample in liquid solvent is proportional to the concentration or partial pressure of the sample in gas phase. The gas sensor can be used for quantitative analysis of gas vapors and determination of Henry constants.

Claims

1. An ionic liquid high temperature piezoelectric gas sensor for determining the concentration of an organic vapor in a gaseous sample comprising:

(a) a quartz crystal microbalance having a transducer surface; and

(b) an ionic liquid film on the transducer surface of the quartz crystal microbalance, the ionic liquid comprising a phosphonium salt;

wherein when the organic vapor is present in the gaseous sample it is absorbed in the ionic liquid film on the transducer surface and changes a resonant frequency of the quartz crystal microbalance proportional to the concentration of the organic vapor in the gaseous sample.

2. The ionic liquid high temperature piezoelectric gas sensor of claim 1, wherein the ionic liquid film has a thickness of about 25 μ

g cm<sup>−

2</sup> or less.

3. The ionic liquid high temperature piezoelectric gas sensor of claim 1, wherein the ionic liquid is phosphonium dodecylbenzene-sulfonate.

4. The ionic liquid high temperature piezoelectric gas sensor of claim 3, wherein the phosphonium dodecylbenzene-sulfonate is P_6,6,6,14DBS.

5. A method of determining the concentration of an organic vapor in a high temperature gaseous sample comprising:

(a) providing an ionic liquid high temperature piezoelectric gas sensor for detecting the concentration of an organic vapor in a gaseous sample, the gas sensor comprising a quartz crystal microbalance having a transducer surface and an ionic liquid film on the transducer surface of the quartz crystal microbalance, wherein (i) the ionic liquid comprises a phosphonium salt and (ii) when the organic vapor is present in the gaseous sample it is absorbed in the ionic liquid film on the transducer surface and changes a resonant frequency of the quartz crystal microbalance;

(b) providing the high temperature gaseous sample to the transducer surface of the ionic liquid piezoelectric gas sensor;

(c) measuring a change in the resonant frequency of the piezoelectric mass sensor upon stabilization of the resonant frequency; and

(d) determining the concentration of the organic vapor in the gaseous sample by the change in the resonant frequency.

6. The method of claim 5, wherein the ionic liquid film has a thickness of about 25 μ

g cm<sup>−

2</sup> or less.

7. The method of claim 5, wherein the ionic liquid is phosphonium dodecylbenzene-sulfonate.

8. The method of claim 7 wherein the phosphonium dodecylbenzene-sulfonate is P_6,6,6,14DBS.

9. A method of determining the concentration of an organic vapor in a high temperature gaseous sample comprising:

(a) providing an ionic liquid high temperature piezoelectric gas sensor for detecting the concentration of an organic vapor in a gaseous sample, the gas sensor comprising a quartz crystal microbalance having a transducer surface and an ionic liquid film on the transducer surface of the quartz crystal microbalance, wherein (i) the ionic liquid comprises a phosphonium salt and (ii) when the organic vapor is present in the gaseous sample it is absorbed in the ionic liquid film on the transducer surface and changes a resonant frequency of the quartz crystal microbalance;

(b) providing a high temperature reference gas to the transducer surface of the ionic liquid piezoelectric gas sensor;

(c) measuring a first reference frequency of the gas sensor;

(d) providing the high temperature gaseous sample to the transducer surface of the ionic liquid piezoelectric gas sensor;

(e) measuring a second resonant frequency of the gas sensor;

(f) subtracting the first resonant frequency from the second resonant frequency to provide a frequency change; and

(g) determining the concentration of the organic vapor in the gaseous sample by the frequency change.

10. The method of claim 9, wherein the ionic liquid film has a thickness of about 25 μ

g cm<sup>−

2</sup> or less.

11. The method of claim 9, wherein the ionic liquid is phosphonium dodecylbenzene-sulfonate.

12. The method of claim 11, wherein the phosphonium dodecylbenzene-sulfonate is P_6,6,6,14DBS.

13. A method of determining the concentration of an organic vapor in a high temperature gaseous sample comprising:

(a) providing a first ionic liquid piezoelectric gas sensor and a second ionic liquid piezoelectric gas sensor, the first and second ionic liquid high temperature piezoelectric gas sensor for detecting the concentration of an organic vapor in a gaseous sample comprising a quartz crystal microbalance having a transducer surface, and an ionic liquid film on the transducer surface of the quartz crystal microbalance, wherein (i) the ionic liquid comprises a phosphonium salt and (ii) when the organic vapor is present in the gaseous sample it is absorbed in the ionic liquid film on the transducer surface and changes a resonant frequency of the quartz crystal microbalance;

(b) providing a high temperature reference gas to the first gas sensor;

(c) providing the high temperature gaseous sample to the second gas sensor;

d) measuring a resonant frequency of the first sensor;

(e) measuring a resonant frequency of the second sensor;

(f) subtracting the resonant frequency of the first sensor from the resonant frequency of the second sensor to provide a frequency difference; and

(g) determining the concentration of the organic vapor in the gaseous sample by the frequency difference.

14. The method of claim 13, wherein the ionic liquid film has a thickness of about 25 μ

g cm<sup>−

2</sup> or less.

15. The method of claim 13, wherein the ionic liquid is phosphonium dodecylbenzene-sulfonate.

16. The method of claim 15, wherein the phosphonium dodecylbenzene-sulfonate is P_6,6,6,14DBS.

17. A method of determining a Henry constant of an organic compound in an ionic liquid comprising:

(a) providing an ionic liquid high temperature piezoelectric gas sensor comprising a quartz crystal microbalance having a transducer surface and a film of the ionic liquid on the transducer surface of the quartz crystal microbalance, wherein the ionic liquid comprises a phosphonium salt;

(b) providing the organic compound at a partial pressure (p_i) in a high temperature gaseous sample to the transducer surface of the ionic liquid piezoelectric gas sensor;

(c) measuring a change in the resonant frequency of the piezoelectric mass sensor upon stabilization of the resonant frequency;

(d) calculating a molar fraction (m_i) of the organic compound in the ionic liquid using Sauerbrey'"'"'s equation from the change in the resonant frequency and total mass of the ionic liquid film on the transducer surface;

(e) determining the Henry constant (C_i) of the organic compound in the gaseous sample using equation p_i=C_im_i, from the partial pressure (p_i) and the molar fraction (m_i) of the organic compound.

18. The method of claim 17, wherein the ionic liquid film has a thickness of about 25 μ

g cm<sup>−

2</sup> or less.

19. The method of claim 17, wherein the ionic liquid is phosphonium dodecylbenzene-sulfonate.

20. The method of claim 19, wherein the phosphonium dodecylbenzene-sulfonate is P_6,6,6,14DBS.