Clearance measurement systems and methods of operation

• US 7,466,143 B2
• Filed: 09/16/2005
• Issued: 12/16/2008
• Est. Priority Date: 09/16/2005
• Status: Active Grant

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Dasgupta, Samhita, Frey, Richard Louis, Andarawis, Emad Andarawis
• Primary Examiner(s): Nguyen; Vincent Q
• Application Number:
  US11/229,251
• Publication Number:
  US 20070222459A1
• Time in Patent Office: 1,187 Days
• Field of Search: 324/644, 324/646, 324/662
• US Class Current: 324/644
• CPC Class Codes: F01D 21/003 Arrangements for testing or measuring for measuring vibrations G01H
• CPC Class Codes: G01B 15/00 Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons characterised by the use of optical techniques G01B9/00, G01B11/00
• CPC Class Codes: G01B 7/14 for measuring distance or clearance between spaced objects or spaced apertures G01B7/30 takes precedence

Abstract

A method is provided and includes exciting a sensor with an incident signal and generating a reflected signal by reflecting the incident signal from the sensor. The incident signal and the reflected signal interfere to form a standing wave. The method also includes processing the signals to determine a sensed parameter based upon a frequency at which the standing wave exhibits a null.

Claims

1. A method comprising:

exciting a sensor with an incident signal;

generating a reflected signal by reflecting the incident signal from the sensor, wherein the incident signal and the reflected signal interfere to form a standing wave;

processing the signals to determine a sensed parameter based upon a frequency at which the standing wave exhibits a null, wherein processing the microwave signals comprises determining a lowest value of an amplitude of the standing wave; and

varying a frequency of the incident signal supplied to the sensor until the standing wave exhibits the null,

wherein the processing further comprises;

generating a feedback signal based on a comparison between the lowest value and the null; and

controlling the frequency of the incident signal supplied to the sensor in response to the feedback signal to minimize a difference between the lowest value and the null.

2. The method of claim 1, wherein the incident and reflected signals comprise microwave signals.

3. The method of claim 1, wherein the incident and reflected signals comprise radio frequency signals.

4. The method of claim 1, wherein the sensed parameter is an impedance between a first object and a second object.

5. The method of claim 4, wherein the sensed parameter is a capacitance between the first object and the second object.

6. The method of claim 1, further comprising measuring a frequency of the incident signal supplied to the sensor.

7. A method comprising:

exciting a sensor with an incident signal;

generating a reflected signal by reflecting the incident signal from the sensor, wherein the incident signal and the reflected signal interfere to form a standing wave;

processing the signals to determine a sensed parameter based upon a frequency at which the standing wave exhibits a null;

transmitting the incident signal to the sensor via a slotted transmission line;

transmitting the reflected signal from the sensor via the slotted transmission line; and

monitoring the signals at a plurality of locations on the slotted transmission line,

wherein the sensed parameter is determined based upon a location of a standing wave null along the slotted transmission line and a frequency at which the standing wave null is detected.

8. A method of measuring a clearance between a first object and a second object, the method comprising:

supplying an incident signal to a sensor disposed on one of the first or second objects;

reflecting the incident signal from the sensor to generate a reflected signal, wherein the incident signal and the reflected signal interfere to form a standing wave; and

processing the signals to determine the clearance between the first and second objects based upon a frequency at which the standing wave exhibits a null, wherein the processing comprises;

determining an impedance between the first and second objects based upon a frequency at which a standing wave null appears, and

determining a capacitance between the first and second objects based upon the frequency at which the standing wave null appears.

9. The method of claim 8, wherein the incident and reflected signals comprise microwave signals.

10. The method of claim 8, wherein the incident and reflected signals comprise radiofrequency signals.

11. The method of claim 8, wherein the first and second objects comprise components in a gas turbine engine, and wherein processing the signals comprises estimating the clearance between the two components in the gas turbine engine.

12. The method of claim 8, wherein the first and second objects comprise components in a steam turbine, and wherein processing the measurement signals comprises estimating the clearance between the two components in the steam turbine.

13. The method of claim 8, further comprising:

transmitting the incident signal to the sensor via a slotted transmission line;

transmitting the reflected signal from the sensor via the slotted transmission line; and

monitoring the signals at a plurality of locations on the slotted transmission line to detect a standing wave null, wherein the sensed parameter is determined based upon a standing wave null location on the slotted transmission line and a frequency at which the standing wave null is detected.

14. A sensor system for measuring a clearance between a first object and a second object, the sensor system comprising:

a sensor disposed on one of the first or second objects, wherein the sensor is configured to receive an incident signal and to reflect the incident signal to generate a reflected signal, wherein the incident signal and the reflected signal interfere to form a standing wave;

an excitation source configured to generate the incident signal; and

a processing unit configured to determine the clearance between the first and second objects based upon a frequency at which the standing wave exhibits a null, wherein the processing unit is configured to;

determine an impedance between the first and second objects based upon the frequency at which a standing wave null appears, and

determine a capacitance between the first and second objects based upon the frequency at which the standing wave null appears.

15. The sensor system of claim 14, wherein the incident and reflected signals comprise microwave signals.

16. The sensor system of claim 14, wherein the incident and reflected signals comprise radiofrequency signals.

17. The sensor system of claim 14, further comprising a waveguide configured to convey the incident signal from the excitation source to the sensor and to convey the reflected signal from the sensor to the processing unit.

18. The sensor system of claim 14, further comprising a directional coupler configured to separate the incident and reflected signals.

19. The sensor system of claim 14, wherein the processing unit comprises a calibration table, a look-up table, a plurality of equations based on first principles, or combinations thereof to determine the clearance based upon the frequency at which the standing wave exhibits the null.

20. A sensor system for measuring a clearance between a first object and a second object, the sensor system comprising:

a sensor disposed on one of the first or second objects, wherein the sensor is configured to receive an incident signal and to reflect the incident signal to generate a reflected signal, wherein the incident signal and the reflected signal interfere to form a standing wave;

an excitation source configured to generate the incident signal;

a processing unit configured to determine the clearance between the first and second objects based upon a frequency at which the standing wave exhibits a null,

wherein the excitation source comprises a variable microwave frequency source configured to vary a frequency of the incident signal supplied to the sensor until the standing wave exhibits the null, the sensor system further comprising;

a null detector for processing the signals to determine a lowest value of an amplitude of the standing wave, wherein the processing unit is further configured to receive the lowest value from the null detector.

21. The sensor system of claim 20, wherein the processing unit is further configured to:

generate a feedback signal based on a comparison between the lowest value and the null; and

control the variable microwave frequency source to vary the frequency of the incident signal supplied to the sensor in response to the feedback signal.

22. The sensor system of claim 20, further comprising a frequency measurement unit for measuring the frequency of the incident signal supplied to the sensor at which the standing wave exhibits the null.

23. A sensor system for measuring a clearance between a first object and a second object, the sensor system comprising:

a sensor disposed on one of the first or second objects, wherein the sensor is configured to receive an incident signal and to reflect the incident signal to generate a reflected signal, wherein the incident signal and the reflected signal interfere to form a standing wave;

a slotted transmission line configured to transmit the incident signal to the sensor and to transmit the reflected signal from the sensor, wherein the slotted transmission line comprises a slot to facilitate detection of a standing wave null at one of a plurality of locations on the slotted transmission line; and

a processing unit configured to process the signals corresponding to each of the plurality of locations to determine the clearance between the first and second objects based upon the location of the standing wave null and a frequency at which the standing wave null is detected, wherein the processing unit is configured to;

determine an impedance between the first and second objects based upon the location of the standing wave null and the frequency at which the standing wave null is detected, and

determine a capacitance between the first and second objects based upon the location of the standing wave null and the frequency at which the standing wave null is detected.

24. The sensor system of claim 23, wherein the incident and reflected signals comprise microwave signals.

25. The sensor system of claim 23, wherein the incident and reflected signals comprise radiofrequency signals.

26. The sensor system of claim 23, further comprising a variable frequency source configured to supply the incident signal to the sensor via the slotted transmission line and to vary a frequency of the incident signal supplied to the sensor until the standing wave null is detected.

27. The sensor system of claim 23, further comprising at least one probe configured to monitor the signals at one or more of the locations along the slot.

28. The sensor system of claim 27, comprising a plurality of probes, wherein each of the probes is configured to monitor the signals at a respective location along the slot.