Method for analyzing and representing x-ray projection images and x-ray examination unit
First Claim
Patent Images
1. A method of analyzing and displaying x-ray projection images using an x-ray examination unit, comprising the steps of:
- radiographing an object using x-rays originating from a radiation source and a focus of the radiation source;
measuring the x-rays penetrating the object by a detector field having a plurality of detector elements, the detector field arranged opposite the focus and after the object relative to an x-radiation direction;
determining x-ray attenuation values from local x-ray intensity values captured by the detector field and from initial x-ray intensity values, the initial x-ray intensity values related to the x-rays before penetrating the object;
generating and displaying a projection image of the object based upon the determined x-ray attenuation values; and
determining a functional relationship between the x-ray attenuation values and a material-equivalent coefficient variable relative to an energy spectrum of the x-rays, wherein the material-equivalent coefficient variable is assigned a value characteristic for one specific material and displayed as an image value when displaying the projection image,wherein the functional relationship is determined according to the formula
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Abstract
The invention relates to a method and an x-ray examination unit for analyzing and representing x-ray projection images with an x-ray examination unit, where the function relation bU=ƒU−1(J˜/J0) is established between the attenuation value and a material-equivalent value as a function of the energy spectrum used, and for the purposes of projection representation, the magnitude of the material-equivalent value bU of a specific material is represented as an image value.
22 Citations
14 Claims
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1. A method of analyzing and displaying x-ray projection images using an x-ray examination unit, comprising the steps of:
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radiographing an object using x-rays originating from a radiation source and a focus of the radiation source; measuring the x-rays penetrating the object by a detector field having a plurality of detector elements, the detector field arranged opposite the focus and after the object relative to an x-radiation direction; determining x-ray attenuation values from local x-ray intensity values captured by the detector field and from initial x-ray intensity values, the initial x-ray intensity values related to the x-rays before penetrating the object; generating and displaying a projection image of the object based upon the determined x-ray attenuation values; and determining a functional relationship between the x-ray attenuation values and a material-equivalent coefficient variable relative to an energy spectrum of the x-rays, wherein the material-equivalent coefficient variable is assigned a value characteristic for one specific material and displayed as an image value when displaying the projection image, wherein the functional relationship is determined according to the formula - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An x-ray examination device for generating two-dimensional projection images of a radiographed object, comprising:
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a radiation source having a focus for radiographing an object; a detector field arranged opposite the focus and after the object relative to an x-radiation direction and having a plurality of detector elements for detecting x-rays penetrating the object; a display unit; and a processing unit for determining x-ray attenuation values J˜
/J0 from local x-ray intensity values J˜
captured by the detector field and from initial x-ray intensity values J0, the initial x-ray intensity values related to the x-rays before penetrating the object and for generating a projection image of the object based upon the determined x-ray attenuation values, wherein the processing unit comprises a calculation unit for determining a functional relationship bU=ƒ
U−
1(J˜
/J0) between the x-ray attenuation values and a material-equivalent coefficient variable bU relative to an energy spectrum of the x-rays,the material-equivalent coefficient variable is assigned a value characteristic for one specific material, and the projection image is displayed on the display unit including the value characteristic for the one specific material, wherein the functional relationship is determined according to the formula - View Dependent Claims (14)
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Specification