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Method for analyzing and representing x-ray projection images and x-ray examination unit

  • US 7,469,034 B2
  • Filed: 04/21/2006
  • Issued: 12/23/2008
  • Est. Priority Date: 04/27/2005
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method of analyzing and displaying x-ray projection images using an x-ray examination unit, comprising the steps of:

  • radiographing an object using x-rays originating from a radiation source and a focus of the radiation source;

    measuring the x-rays penetrating the object by a detector field having a plurality of detector elements, the detector field arranged opposite the focus and after the object relative to an x-radiation direction;

    determining x-ray attenuation values from local x-ray intensity values captured by the detector field and from initial x-ray intensity values, the initial x-ray intensity values related to the x-rays before penetrating the object;

    generating and displaying a projection image of the object based upon the determined x-ray attenuation values; and

    determining a functional relationship between the x-ray attenuation values and a material-equivalent coefficient variable relative to an energy spectrum of the x-rays, wherein the material-equivalent coefficient variable is assigned a value characteristic for one specific material and displayed as an image value when displaying the projection image,wherein the functional relationship is determined according to the formula

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