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Electronic device, failure prediction method, and computer product

  • US 7,469,189 B2
  • Filed: 06/23/2004
  • Issued: 12/23/2008
  • Est. Priority Date: 02/06/2004
  • Status: Active Grant
First Claim
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1. An electronic device that includes a part prone to aged deterioration, comprising:

  • an environmental load applying unit that applies a first environmental load of a boundary secure operation value between a secure operation environment and non-secure operation environment of the electronic device or a second environmental load of a value that is close to the boundary secure operation value within a range of a secure operation of the electronic device to the part;

    an error detecting unit that detects an error in the part with the first or second environmental load applied; and

    a failure predicting unit that predicts a failure of the part based on the error detected.

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