Method for a liquid chemical concentration analysis system

• US 7,471,379 B2
• Filed: 09/10/2007
• Issued: 12/30/2008
• Est. Priority Date: 09/26/2005
• Status: Active Grant

• Current Assignee: Jetalon Solutions, Inc.
• Original Assignee: Jetalon Solutions, Inc.
• Inventors: Boyd, Charles Eric, Chiarello, Ronald P., McPhee, Duncan A.
• Primary Examiner(s): Pham; Hoa Q
• Application Number:
  US11/852,880
• Publication Number:
  US 20080001105A1
• Time in Patent Office: 477 Days
• Field of Search: 356128-137, 356445-448, 356/244, 356/246, 356432-440
• US Class Current: 356/136
• CPC Class Codes: G01N 21/0303 Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment G01N21/031 - G01N21/15 take precedence
• CPC Class Codes: G01N 21/4133 Refractometers, e.g. differential
• CPC Class Codes: G01N 21/552 Attenuated total reflection

Abstract

An apparatus utilizes optical reflectivity (REF) to measure concentrations in liquids. The REF optical system is packaged in a compact and cost-effective form factor. An electronic circuit drives the optical system. The miniaturized REF sensor is situated in an optical-fluidic cell or an optical-fluidic manifold with an optical window in contact with the liquid. Changes in a total internal reflection (TIR) signal are sensitive to temperature and concentration of the liquid. These changes in the TIR signal are used to accurately determine the concentration in the liquid. The liquids may be either static or dynamic.

Claims

1. A method comprising:

causing a sample to contact a sensing surface of an optical sensor;

directing light at the sensing surface so that some of the light will pass through the sensing surface to the sample and some of the light will reflect off of a sample/sensing surface interface and impinge on a plurality of pixel positions on a photodetector;

obtaining pixel output signals from at least some of the pixel positions on the photodetector

calculating a pixel position using at least in part a mass moment algorithm and the pixel output signals;

determining the concentration of the sample using at least in part the calculated pixel position.

2. The method of claim 1 further comprising

generating a normalized total internal reflection data set based at least in part on the pixel output signals;

and,

calculating the pixel position using at least in part the mass moment algorithm and the normalized total internal reflection data set.

3. The method of claim 2 further comprising

numerically differentiating the normalized total internal reflection data set using a smooth derivative procedure to generate a first derivative of the normalized total internal reflection data;

and,

calculating the pixel positions using at least in part the mass moment algorithm and the first derivative of the normalized total internal reflection data set.

4. The method of claim 1 wherein the mass moment algorithm is a weighted mass moment algorithm.

5. The method of claim 1 wherein determining the concentration of the sample using at least in part the calculated pixel position includes determining the index of refraction of the sample.

6. The method of claim 5 wherein the index of refraction of the sample is determined without determining the critical angle.

7. The method of claim 1 wherein the concentration of the sample is temperature compensated.

8. The method of claim 7 wherein the temperature compensated concentration is determined by the uncompensated concentration plus the sum of the temperature of the sample less the calibration temperature times a first constant, and the temperature of the photodetector less the temperature of the sample times a second constant where the constants are determined from initialization and calibration of the optical sensor.

9. A method comprising:

causing a sample to contact a sensing surface of an optical sensor;

directing light at the sensing surface so that some of the light will pass through the sensing surface to the sample and some of the light will reflect off of a sample/sensing surface interface and impinge on a plurality of pixel positions on a photodetector;

digitizing a pixel output signal from at least some of the pixel positions on the photodetector to generate a digital pixel output data set;

determining the index of refraction of the sample using at least in part the digital pixel output data set;

without determining the critical angle;

determining the concentration of the sample using at least in part the determined index of refraction.

10. The method of claim 9 wherein the index of refraction is temperature compensated.

11. The method of claim 10 wherein the temperature compensation is based on the temperature of the sample.

12. The method of claim 11 wherein the temperature compensation is also based on the temperature of the photodetector.

13. The method of claim 10 wherein the temperature compensated index of refraction is determined by the measured index of refraction less the sum of the temperature of the sample minus 20 times a first constant, and the temperature of the photodetector minus 20 times a second constant where the constants are determined from initialization and calibration of the optical sensor.

14. The method of claim 13 wherein the first constant is approximately 1.3e-04 and the second constant is approximately 0.3e-04.

15. The method of claim 9 further comprising a three stage calibration of the sensor, wherein one stage includes translating the pixel position into a measured temperature uncompensated index of refraction;

another stage includes calculating a temperature compensated index of refraction and yet another stage includes translating the temperature compensated index of refraction into a concentration of the sample.

16. A method comprising:

causing a sample to contact a sensing surface of an optical sensor;

directing light at the sensing surface so that some of the light will pass through the sensing surface to the sample and some of the light will reflect off of a sample/sensing surface interface and impinge on a plurality of pixels of a photodetector of the optical sensor;

obtaining digital pixel output signals from at least some of the pixels of the photodetector;

generating a normalized total internal reflection data set;

calculating a mass moment pixel position using at least in part a mass moment algorithm and the normalized total internal reflection data set;

determining the concentration of the sample using the mass moment pixel position and a correlation between the position of the pixel and the concentration of the sample.

17. The method of claim 16 wherein the correlation between the position of the pixel and the concentration of the sample comprises a correlation between the index of refraction and different concentrations of a sample and a correlation between the index of refraction and the position of pixels of the photodetector in the optical sensor.

18. The method of claim 17 wherein the correlation between the index of refraction and the position of pixels of the photodetector in the optical sensor is an equation for a correlation curve.

19. The method of claim 16 wherein the mass moment pixel position is an integer.

20. The method of claim 16 wherein the mass moment pixel position is a rational number.

21. The method of claim 16 further comprising

obtaining a first derivative of the normalized total internal reflection data set;

and,

calculating the mass moment pixel positions using at least in part the mass moment algorithm and the first derivative of the normalized total internal reflection data set.

22. The method of claim 16 wherein the correlation between the position of the pixel and the concentration of the sample is temperature compensated.