Methods and apparatus for determining the size and shape of particles

• US 7,471,393 B2
• Filed: 03/07/2005
• Issued: 12/30/2008
• Est. Priority Date: 03/06/2004
• Status: Active Grant

• Current Assignee: Michael Trainer
• Original Assignee: Michael Trainer
• Inventors: Trainer, Michael
• Primary Examiner(s): Pham; Hoa Q
• Application Number:
  US10/598,443
• Publication Number:
  US 20070165225A1
• Time in Patent Office: 1,394 Days
• Field of Search: 356336-343, 250/574
• US Class Current: 356/336
• CPC Class Codes: G01N 15/0205 by optical means
• CPC Class Codes: G01N 15/1459 the analysis being performed on a sample stream
• CPC Class Codes: G01N 2015/1486 Counting the particles
• CPC Class Codes: G01N 2015/1493 Particle size
• CPC Class Codes: G01N 2015/1497 Particle shape

Abstract

An instrument for measuring the size distribution of a particle sample by counting and classifying particles into selected size ranges. The particle concentration is reduced to the level where the probability of measuring scattering from multiple particles at one time is reduced to an acceptable level. A light beam is focused or collimated through a sample cell, through which the particles flow. As each particle passes through the beam, it scatters, absorbs, and transmits different amounts of the light, depending upon the particle size. So both the decrease in the beam intensity, due to light removal by the particle, and increase of light, scattered by the particle, may be used to determine the particle size, to classify the particle and count it in a certain size range. If all of the particles pass through a single beam, then many small particles must be counted for each large one because typical distributions are uniform on a particle volume basis, and the number distribution is related to the volume distribution by the particle diameter cubed.

Claims

1. A method for improving accuracy of particle parameter distributions, the particle parameter distributions being obtained by directing light onto particles and observing light scattered from the particles so as to observe special events, the method comprising the steps of:

a) selecting an integration time which is sufficiently short such that each special event creates a large characteristic change of integrated scatter signal parameters, when observed by a detector,

b) deriving data sets corresponding to particles, by integrating signals obtained from a plurality of detectors, using the integration time selected in step (a),

c) sorting the data sets obtained in step (b) into groups with similar characteristics,

d) rejecting groups with undesirable characteristics, while accepting other groups for further analysis,

e) calculating a particle parameter distribution from an average of said data sets, from each accepted group, to obtain a separate parameter distribution for each accepted group, and

f) combining the individual particle parameter distributions from said groups to produce a final particle parameter distribution.

2. The method of claim 1, further comprising selecting said special events from the group consisting of rare particles, large particles, and scatter signal defects.

3. Apparatus for improving accuracy of particle parameter distributions, the particle parameter distributions being obtained by directing light onto particles and observing light scattered from the particles so as to observe special events, the apparatus comprising:

a) means for selecting an integration time which is sufficiently short such that each special event creates a large characteristic change of integrated scatter signal parameters, when observed by a detector,

b) means for deriving data sets corresponding to particles, by integrating signals obtained from a plurality of detectors, using the integration time selected in the selecting means,

c) means for sorting the data sets, obtained from the deriving means, into groups with similar characteristics,

d) means for rejecting groups with undesirable characteristics while accepting other groups for further analysis,

e) means for calculating a particle parameter distribution from an average of said data sets, from each accepted group, to obtain a separate parameter distribution for each accepted group, and

f) means for combining the individual particle parameter distributions from said groups to produce a final particle parameter distribution.

4. The apparatus of claim 3, wherein said special events are selected from the group consisting of rare particles, large particles, and scatter signal defects.

5. A method for improving accuracy of particle parameter distributions, the particle parameter distributions being obtained by directing light onto particles and observing light scattered from the particles so as to observe special events, the method comprising the steps of:

a) selecting a data collection period which is sufficiently short such that each special event creates a large characteristic change in a function created in step (c) below, when observed by a detector,

b) deriving data sets corresponding to particles, by digital sampling of signals obtained from at least one detector, using the data collection period selected in step (a),

c) creating a function of each data set,

d) sorting the data sets obtained in step (b) into groups with similar characteristics for said function,

e) rejecting groups with undesirable characteristics, while accepting other groups for further analysis,

f) calculating a particle parameter distribution from an average of said functions of said data sets, from each accepted group, to obtain a separate parameter distribution for each accepted group, and

g) combining the individual particle parameter distributions from said groups to produce a final particle parameter distribution.

6. The method of claim 5, further comprising selecting said special events from the group consisting of rare particles, large particles, and scatter signal defects.

7. Apparatus for improving accuracy of particle parameter distributions, the particle parameter distributions being obtained by directing light onto particles and observing light scattered from the particles so as to observe special events, the apparatus comprising:

a) means for selecting a data collection period which is sufficiently short such that each special event creates a large characteristic change in a function created by a creating means, below, when observed by a detector,

b) means for deriving data sets corresponding to particles, by digital sampling of signals obtained from at least one detector, using the data collection period established by the selecting means,

c) means for creating a function, of each of said data sets,

d) means for sorting the data sets, obtained from the deriving means, into groups with similar characteristics for said function,

e) means for rejecting groups with undesirable characteristics, while accepting other groups for further analysis,

f) means for calculating a particle parameter distribution from an average of functions of said data sets, from each accepted group, to obtain a separate parameter distribution for each accepted group, and

g) means for combining the individual particle parameter distributions from said groups to produce a final particle parameter distribution.

8. The apparatus of claim 7, wherein said special events are selected from the group consisting of rare particles, large particles, and scatter signal defects.