Cargo dimensional and weight analyzing system

• US 7,474,389 B2
• Filed: 12/19/2006
• Issued: 01/06/2009
• Est. Priority Date: 12/19/2006
• Status: Expired due to Fees

• Current Assignee: Michael L. Mcbride
• Original Assignee: The Advantage Network, LLC
• Inventors: Lilly, David, Greenberg, Dean
• Primary Examiner(s): Tarcza; Thomas H
• Assistant Examiner(s): Ratcliffe; Luke D
• Application Number:
  US11/641,476
• Publication Number:
  US 20080143997A1
• Time in Patent Office: 749 Days
• Field of Search: 356 301- 315, 356 401- 41, 356 501- 515, 356 6- 22
• US Class Current: 356/5.1
• CPC Class Codes: G01B 11/00 Measuring arrangements characterised by the use of optical techniques
• CPC Class Codes: G01B 11/026 by measuring distance between sensor and object G01B11/0608 takes precedence
• CPC Class Codes: G01B 11/0608 Height gauges
• CPC Class Codes: G01C 11/025 by scanning the object

Abstract

A laser scanner apparatus is disclosed herein for measuring the geometry and physical dimensions of one or more objects in a specified location or platform. The specified location or platform is within a range less than a predetermined maximum object distance. The laser scanner includes a waveform generator that generates a predetermined reference waveform to an analog laser that provides an modulated laser beam responsive to the reference waveform, an optical scanning system which 1) transmits and scans the object with the modulated laser light beam and 2) includes a means for receiving reflected the modulated laser light from the surface of an object on the platform or specified location, an avalanche photo-detector positioned to receive the processed modulated light from the optical processing system, and convert energy in the incident light into an amplitude-modulated range signal, a mixer is provided to down-convert the frequency of the range signal into a lower (LF) frequency. In practice, a first electrical circuit receives the down-converted range signal and converts it into a converted waveform that has a sinusoidal wave falling and rising that correspond to the zero crossings. The reference waveform is also applied to a mixer that down-converts it to the LF frequency. A second electrical circuit receives the down-converted reference waveform and converts it a second converted waveform that has a sinusoidal wave falling and rising that correspond to the zero crossings. A computer receives the first and second converted waveforms and outputs a highly accurate signal indicative of the time delay there between. The time delay is used by the computer system to determine the physical dimension of the particular scanning.

Claims

1. A laser scanner apparatus for measuring two and three dimensional parameters of one or more objects on a platform, the apparatus comprising:

a waveform generator to generate a predetermined reference waveform;

an analog laser diode to supply a modulated laser beam responsive to the reference waveform;

an optical scanning system for scanning a scene with a modulated laser beam and receiving a reflected modulated light from the objects on said platform, said optical scanning system having a hexagonal reflector connected to a series of computer control motors for moving said optical scanning system along a path, and said modulated laser beam being a result of the analog laser diode being driven by a signal modulated in the range of 20-30 megahertz;

a plurality of mirrors positioned on sides of said platform to provide for reflection of the modulated laser beam against the objects in additional dimensions;

a photo-detector positioned to receive said processed modulated light from the optical means, said photo-detector converting energy in said laser light into a time-modulated signal;

a first electrical circuit for converting the time-modulated signal into a converted sinusoidal waveform that has zero crossing in said time-modulated range signal;

a second electrical circuit for converting the reference waveform into a second converted sinusoidal waveform that has zero crossings in said reference waveform;

a phase comparator coupled to receive said first and second converted waveforms and output a signal indicative of the time difference there between; and

a processor means for displaying and recording physical measurements of objects in a specific location.

2. The laser scanner of claim 1 wherein said waveform generator comprises means for forming a sinusoidal waveform, so that said reference waveform has a sinusoidal shape and said intensity-modulated laser beam has a sinusoidally-varying intensity.

3. The laser scanner of claim 1 wherein said physical measurements provide a volumetric estimate of the object.

4. A laser scanner apparatus for measuring two and three dimensional parameters of one or more objects on a platform, the apparatus comprising:

a waveform generator to generate a predetermined reference waveform;

an analog laser diode to supply a modulated laser beam responsive to the reference waveform;

an optical scanning system for scanning a scene with a modulated laser beam and receiving a reflected modulated light from the objects on said platform, said optical scanning system having a hexagonal reflector connected to a series of computer control motors for moving said optical scanning system along a path, and said modulated laser beam being a result of the analog laser diode being driven by a signal modulated in the range of 20-30 megahertz;

a moveable arm system on which the optical scanning system is attached, the moveable arm system to allow the optical scanning system to move across multiple positions to scan the objects on the platform from those positions;

a photo-detector positioned to receive said processed modulated light from the optical means, said photo-detector converting energy in said laser light into a phase-modulated signal;

a first electrical circuit for converting the phase-modulated signal into a converted sinusoidal waveform that has zero crossing in said phase-modulated range signal;

a second electrical circuit for converting the reference waveform into a second converted sinusoidal waveform that has zero crossings in said reference waveform;

a phase comparator coupled to receive said first and second converted waveforms and output a signal indicative of the phase difference there between; and

a processor means for displaying and recording physical measurements of objects in a specific location.

5. The laser scanner of claim 4 wherein said waveform generator comprises means for forming a sinusoidal waveform, so that said reference waveform has a sinusoidal shape and said intensity-modulated laser beam has a sinusoidally-varying intensity.

6. The laser scanner of claim 4 wherein said physical measurements provide a volumetric estimate of the object.

7. A laser scanner apparatus comprising:

a waveform generator to generate a predetermined reference waveform;

an analog laser diode to supply a modulated laser beam responsive to the reference waveform;

an optical scanning system to scan a scene with a modulated laser beam and receive a reflected modulated light from objects on a platform, said optical scanning system having a hexagonal reflector connected to a series of computer control motors for moving said optical scanning system along a path, and said modulated laser beam being a result of the analog laser diode being driven by a signal modulated in the range of 20-30 megahertz;

a moveable arm system on which the optical scanning system is attached, the moveable arm system to allow the optical scanning system to move across multiple positions to scan the objects on the platform from those positions;

a photo-detector positioned to receive said processed modulated light from the optical means, said photo-detector to convert energy in said laser light into a time-modulated signal;

a first electrical circuit to convert the time-modulated signal into a converted sinusoidal waveform that has zero crossing in said time-modulated range signal;

a second electrical circuit to convert the reference waveform into a second converted sinusoidal waveform that has zero crossings in said reference waveform;

a phase comparator coupled to receive said first and second converted waveforms and output a signal indicative of the time difference there between; and

a processor to display and record physical measurements of the objects on the platform.