Method for microstructuring flat glass substrates

• US 7,476,623 B2
• Filed: 10/04/2005
• Issued: 01/13/2009
• Est. Priority Date: 10/09/2004
• Status: Expired due to Fees

• Current Assignee: Schott AG (Carl-Zeiss-Stiftung)
• Original Assignee: Schott AG (Carl-Zeiss-Stiftung)
• Inventors: Schreder, Bianca, Mund, Dietrich, Sprenger, Dirk, Liebald, Rainer, Leib, Juergen, Pawlowski, Edgar
• Primary Examiner(s): Richards; N Drew
• Assistant Examiner(s): Garcia; Joannie A
• Application Number:
  US11/243,443
• Publication Number:
  US 20060079094A1
• Time in Patent Office: 1,197 Days
• Field of Search: 438/711, 438/717, 438/723, 438/736, 438/743, 438/FOR.120, 438/FOR.388, 216/67, 216/80
• US Class Current: 438/711
• CPC Class Codes: C03C 15/00 Surface treatment of glass, not in the form of fibres or filaments, by etching etching or surface-brightening compositions, in general C09K13/00

Abstract

In the method for microstructuring flat glass substrates a substrate surface of a glass substrate is coated with at least one structured mask layer and subsequently exposed to a chemically reactive ion etching process (RIE) with at least one chemical etching gas. In order to provide the same or a higher quality etching and etching rate even for economical types of glass the chemical etching gas is mixed with at least one noble gas, so that the proportion of sputtering etching in the ion etching process is significantly increased.

Claims

1. A method for microstructuring flat multi-component glass substrates, said method comprising the steps of:

a) coating a substrate surface of a flat glass substrate with a metal layer;

b) subjecting the metal layer to a structuring process to form at least one structured mask layer, said flat glass substrate consisting of a multi-component glass containing at least three oxide ingredients;

b) mixing a chemical etching gas with at least one noble gas in a mixture ratio of the chemical etching gas to the at least one noble gas of from 2;

1 to 6;

1 in order to form an etching gas mixture; and

c) performing a chemically reactive ion etching process in which the substrate surface coated with the at least one structured mask layer is exposed to the etching gas mixture;

wherein sputtering etching occurring in the ion etching process is significantly increased by the presence of the at least one noble gas in the etching gas mixture but a major portion of the etching gas mixture consists of the chemical etching gas.

2. The method as defined in claim 1, wherein said metal layer is a chromium layer.

3. The method as defined in claim 1, wherein said metal layer is applied to the substrate surface using a magnetron sputtering process in order to coat said substrate surface with said metal layer.

4. The method as defined in claim 1, wherein the metal layer has a thickness such that the metal layer is completely etched away in subsequent ion etching processes.

5. The method as defined in claim 1, wherein the metal layer is structured by a photolithographic process.

6. The method as defined in claim 1, wherein a resist layer is applied to the metal layer, said resist layer is illuminated and then developed and subsequently illuminated metal regions are etched away.

7. The method as defined in claim 6, further comprising a soft-bake treatment after etching away the resist layer and/or a hard-bake treatment after developing the resist layer.

8. The method as defined in claim 1, further comprising removing metal mask layer residue after the ion etching process by wet chemical methods.